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Xavier Llovet

Showing results (1-10 of 14) with videos related to

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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|December 25, 2009
Electron probe microanalysis of thin films and multilayers using the computer program XFILMXavier Llovet, Claude Merlet
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 13, 2015
Electron Probe Microanalysis: A Review of the Past, Present, and FutureRomano Rinaldi, Xavier Llovet
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 1, 2020
Determination of Mass Attenuation Coefficients of Th, U, Np, and Pu for Oxygen K<i>α</i> X-Rays Using an Electron MicroprobePhilipp Pöml, Xavier Llovet
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 16, 2017
PENEPMA: A Monte Carlo Program for the Simulation of X-Ray Emission in Electron Probe MicroanalysisXavier Llovet, Francesc Salvat
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 1, 2013
Analysis of chemical changes and microstructure characterization during deformation in ferritic stainless steelAndrés Núñez, Xavier Llovet, Juan F Almagro
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|November 25, 2021
Electron Probe Microanalysis of Transition Metals using L lines: The Effect of Self-absorptionXavier Llovet, Aurélien Moy, John H Fournelle
Journal of Applied Physics|August 23, 2016
Use of the Bethe Equation for Inner-Shell Ionization by Electron ImpactCedric J Powell, Xavier Llovet, Francesc Salvat
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 25, 2023
Assessing the Accuracy of Mass Attenuation Coefficients for Soft X-ray EPMAXavier Llovet, Philipp Pöml, Aurélien Moy, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|August 30, 2013
Low-voltage electron-probe microanalysis of Fe-Si compounds using soft X-raysPhillip Gopon, John Fournelle, Peter E Sobol, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 6, 2023
Element Depletion Due to Missing Boundary Fluorescence in Electron Probe Microanalysis: The Case of Ni in OlivineXavier Llovet, Maxim Gavrilenko, Valentina G Batanova, et al.
Pageof 2

Showing results (1-10 of 14) with videos related to

Sort By:
Pageof 2
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|December 25, 2009
Electron probe microanalysis of thin films and multilayers using the computer program XFILMXavier Llovet, Claude Merlet
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 13, 2015
Electron Probe Microanalysis: A Review of the Past, Present, and FutureRomano Rinaldi, Xavier Llovet
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 1, 2020
Determination of Mass Attenuation Coefficients of Th, U, Np, and Pu for Oxygen K<i>α</i> X-Rays Using an Electron MicroprobePhilipp Pöml, Xavier Llovet
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 16, 2017
PENEPMA: A Monte Carlo Program for the Simulation of X-Ray Emission in Electron Probe MicroanalysisXavier Llovet, Francesc Salvat
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 1, 2013
Analysis of chemical changes and microstructure characterization during deformation in ferritic stainless steelAndrés Núñez, Xavier Llovet, Juan F Almagro
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|November 25, 2021
Electron Probe Microanalysis of Transition Metals using L lines: The Effect of Self-absorptionXavier Llovet, Aurélien Moy, John H Fournelle
Journal of Applied Physics|August 23, 2016
Use of the Bethe Equation for Inner-Shell Ionization by Electron ImpactCedric J Powell, Xavier Llovet, Francesc Salvat
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 25, 2023
Assessing the Accuracy of Mass Attenuation Coefficients for Soft X-ray EPMAXavier Llovet, Philipp Pöml, Aurélien Moy, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|August 30, 2013
Low-voltage electron-probe microanalysis of Fe-Si compounds using soft X-raysPhillip Gopon, John Fournelle, Peter E Sobol, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 6, 2023
Element Depletion Due to Missing Boundary Fluorescence in Electron Probe Microanalysis: The Case of Ni in OlivineXavier Llovet, Maxim Gavrilenko, Valentina G Batanova, et al.
Pageof 2