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Xue-Zeng Zhao

Showing results (1-10 of 4) with videos related to

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The Review of Scientific Instruments|March 5, 2009
Application of triangular atomic force microscopy cantilevers to friction measurement with the improved parallel scan methodYu-Liang Wang, Xue-Zeng Zhao
The Review of Scientific Instruments|April 7, 2007
Improved parallel scan method for nanofriction force measurement with atomic force microscopyYu-Liang Wang, Xue-Zeng Zhao, Fa-Quan Zhou
Scanning|April 2, 2011
Application of 3 × 3 transformation matrix in the correction of three-dimensional AFM image tilts through coordinate transformationAdedayo S Adebayo, Xue-zeng Zhao, Fei Wang, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|August 25, 2010
An operating method with lateral scan for reducing the error in topography caused by the tip-sample angle in atomic force microscopyFa-Quan Zhou, Xue-Zeng Zhao, Fei Wang, et al.
Pageof 1

Showing results (1-10 of 4) with videos related to

Sort By:
Pageof 1
The Review of Scientific Instruments|March 5, 2009
Application of triangular atomic force microscopy cantilevers to friction measurement with the improved parallel scan methodYu-Liang Wang, Xue-Zeng Zhao
The Review of Scientific Instruments|April 7, 2007
Improved parallel scan method for nanofriction force measurement with atomic force microscopyYu-Liang Wang, Xue-Zeng Zhao, Fa-Quan Zhou
Scanning|April 2, 2011
Application of 3 × 3 transformation matrix in the correction of three-dimensional AFM image tilts through coordinate transformationAdedayo S Adebayo, Xue-zeng Zhao, Fei Wang, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|August 25, 2010
An operating method with lateral scan for reducing the error in topography caused by the tip-sample angle in atomic force microscopyFa-Quan Zhou, Xue-Zeng Zhao, Fei Wang, et al.
Pageof 1