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Yasutoshi Kotaka

Showing results (1-10 of 10) with videos related to

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Ultramicroscopy|March 15, 2011
Analysis of EEL spectrum of low-loss region using the C(s)-corrected STEM-EELS method and multivariate analysisTakashi Yamazaki, Yasutoshi Kotaka, Yuji Kataoka
Ultramicroscopy|August 30, 2005
An expanded approach to noise reduction from high-resolution STEM images based on the maximum entropy methodNobuto Nakanishi, Yasutoshi Kotaka, Takashi Yamazaki
Ultramicroscopy|August 30, 2005
Precise measurement of third-order spherical aberration using low-order zone-axis RonchigramsTakashi Yamazaki, Yasutoshi Kotaka, Yoshio Kikuchi, et al.
Ultramicroscopy|May 11, 2010
Study of atomic resolved plasmon-loss image by spherical aberration-corrected STEM-EELS methodTakashi Yamazaki, Yasutoshi Kotaka, Mineharu Tsukada, et al.
Ultramicroscopy|July 23, 2013
Bloch wave simulations in the frozen lattice approximationTakashi Yamazaki, Masahiro Ohtsuka, Yasutoshi Kotaka, et al.
Ultramicroscopy|October 16, 2013
Image formation mechanisms of spherical aberration corrected BF STEM imaging methodsYasutoshi Kotaka, Takashi Yamazaki, Masahiro Ohtsuka, et al.
Ultramicroscopy|July 17, 2012
Imaging of light and heavy atomic columns by spherical aberration corrected middle-angle bright-field STEMMasahiro Ohtsuka, Takashi Yamazaki, Yasutoshi Kotaka, et al.
Ultramicroscopy|October 13, 2009
Effect of chromatic aberration on atomic-resolved spherical aberration corrected STEM imagesKoji Kuramochi, Takashi Yamazaki, Yasutoshi Kotaka, et al.
Ultramicroscopy|June 30, 2007
Measurement of twofold astigmatism of probe-forming lens using low-order zone-axis ronchigramKoji Kuramochi, Takashi Yamazaki, Yasutoshi Kotaka, et al.
Acta Crystallographica. Section A, Foundations of Crystallography|December 24, 2009
Effect of convergent beam semiangle on image intensity in HAADF STEM imagesKoji Kuramochi, Yasutoshi Kotaka, Takashi Yamazaki, et al.
Pageof 1

Showing results (1-10 of 10) with videos related to

Sort By:
Pageof 1
Ultramicroscopy|March 15, 2011
Analysis of EEL spectrum of low-loss region using the C(s)-corrected STEM-EELS method and multivariate analysisTakashi Yamazaki, Yasutoshi Kotaka, Yuji Kataoka
Ultramicroscopy|August 30, 2005
An expanded approach to noise reduction from high-resolution STEM images based on the maximum entropy methodNobuto Nakanishi, Yasutoshi Kotaka, Takashi Yamazaki
Ultramicroscopy|August 30, 2005
Precise measurement of third-order spherical aberration using low-order zone-axis RonchigramsTakashi Yamazaki, Yasutoshi Kotaka, Yoshio Kikuchi, et al.
Ultramicroscopy|May 11, 2010
Study of atomic resolved plasmon-loss image by spherical aberration-corrected STEM-EELS methodTakashi Yamazaki, Yasutoshi Kotaka, Mineharu Tsukada, et al.
Ultramicroscopy|July 23, 2013
Bloch wave simulations in the frozen lattice approximationTakashi Yamazaki, Masahiro Ohtsuka, Yasutoshi Kotaka, et al.
Ultramicroscopy|October 16, 2013
Image formation mechanisms of spherical aberration corrected BF STEM imaging methodsYasutoshi Kotaka, Takashi Yamazaki, Masahiro Ohtsuka, et al.
Ultramicroscopy|July 17, 2012
Imaging of light and heavy atomic columns by spherical aberration corrected middle-angle bright-field STEMMasahiro Ohtsuka, Takashi Yamazaki, Yasutoshi Kotaka, et al.
Ultramicroscopy|October 13, 2009
Effect of chromatic aberration on atomic-resolved spherical aberration corrected STEM imagesKoji Kuramochi, Takashi Yamazaki, Yasutoshi Kotaka, et al.
Ultramicroscopy|June 30, 2007
Measurement of twofold astigmatism of probe-forming lens using low-order zone-axis ronchigramKoji Kuramochi, Takashi Yamazaki, Yasutoshi Kotaka, et al.
Acta Crystallographica. Section A, Foundations of Crystallography|December 24, 2009
Effect of convergent beam semiangle on image intensity in HAADF STEM imagesKoji Kuramochi, Yasutoshi Kotaka, Takashi Yamazaki, et al.
Pageof 1