Related Experiment Video
Updated: Aug 16, 2026

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
Published on: October 11, 2016
Precise measurement of third-order spherical aberration using low-order zone-axis Ronchigrams
Takashi Yamazaki1, Yasutoshi Kotaka, Yoshio Kikuchi
1Department of Physics, Tokyo University of Science, 1-3 Kagurazaka/Shinjuku-ku, Tokyo 162-8601, Japan. yamazaki@rs.kagu.tus.ac.jp
Abstract:
A method for the measurement of third-order spherical aberration coefficients (C(s)) is suggested, using low-order zone-axis Ronchigrams of a crystalline material. The validity of the method is confirmed using simulated and experimental Ronchigrams taken with various probe-forming lens configurations. The precision of the measured C(s) value is drastically improved compared with that obtained from the power spectrum-analysis method. In addition, a method for roughly estimating defocus values is presented.
Related Concept Videos
Radius of Gyration of an Area
Spherical Coordinates
