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ACS Nano|December 14, 2023
Ultrafast and Broad-Band Graphene Heterojunction Photodetectors with High GainMeng-Yu Tsai, Tsung-Han Tsai, Ashish Chhaganlal Gandhi, et al.
Electrophoresis|August 18, 2012
Dielectrophoretic placement of quasi-zero-, one-, and two-dimensional nanomaterials into nanogap for electrical characterizationsYen-Fu Lin, Shao-Chien Chiu, Sheng-Tsung Wang, et al.
ACS Nano|November 17, 2025
Bi2O2Se-Based Monolithic Floating-Gate Nonvolatile Memory with Enhanced Charge Retention and Switching PerformanceChi-Chun Cheng, Hsing-Chien Chien, Tai-Ting Lee, et al.
Advanced Materials (Deerfield Beach, Fla.)|December 28, 2018
High Mobilities in Layered InSe Transistors with Indium-Encapsulation-Induced Surface Charge DopingMengjiao Li, Che-Yi Lin, Shih-Hsien Yang, et al.
ACS Applied Materials & Interfaces|September 1, 2020
Facile and Reversible Carrier-Type Manipulation of Layered MoTe2 Toward Long-Term Stable ElectronicsMengjiao Li, Che-Yi Lin, Yuan-Ming Chang, et al.
ACS Applied Materials & Interfaces|April 3, 2025
Improved Metal-Semiconductor Interface in Monolayer (1L)-MoS2 via Thermally-Driven Ag Filaments as Atomic Scale Edge Contacts Triggered by Selective Annealing Process Using Long Wavelength (1064 nm) Pulsed LaserSumayah-Shakil Wani, Yao-Ren Kuo, K M M D K Kimbulapitiya, et al.
Nature Communications|June 14, 2020
Oxidation-boosted charge trapping in ultra-sensitive van der Waals materials for artificial synaptic featuresFeng-Shou Yang, Mengjiao Li, Mu-Pai Lee, et al.
Advanced Science (Weinheim, Baden-Wurttemberg, Germany)|July 13, 2022
Reversible Charge-Polarity Control for Multioperation-Mode Transistors Based on van der Waals HeterostructuresCiao-Fen Chen, Shih-Hsien Yang, Che-Yi Lin, et al.
Science Advances|December 8, 2023
Silicon-van der Waals heterointegration for CMOS-compatible logic-in-memory designMu-Pai Lee, Caifang Gao, Meng-Yu Tsai, et al.
Advanced Materials (Deerfield Beach, Fla.)|May 21, 2026
Stable Analog Weight Programming in Single-Crystalline van der Waals Ferroelectric Transistors for Reliable Computing-in-MemoryMengjiao Li, Feng-Shou Yang, Yanan Liu, et al.
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