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Journal of Electron Microscopy|August 31, 2004
HAADF-STEM imaging with sub-angstrom probes: a full Bloch wave analysisYiping Peng, Peter D Nellist, Stephen J PennycookMicroscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|January 4, 2008
Spatial resolution and information transfer in scanning transmission electron microscopyYiping Peng, Mark P Oxley, Andrew R Lupini, et al.Ultramicroscopy|April 26, 2017
The impact of STEM aberration correction on materials scienceStephen J PennycookMicroscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 16, 2013
Identifying and correcting scan noise and drift in the scanning transmission electron microscopeLewys Jones, Peter D NellistMicron (Oxford, England : 1993)|January 29, 2014
Testing the accuracy of the two-dimensional object model in HAADF STEMLewys Jones, Peter D NellistJournal of Electron Microscopy|September 28, 2011
Vortex beams for atomic resolution dichroismJuan C Idrobo, Stephen J PennycookJournal of Electron Microscopy|November 8, 2008
Rapid autotuning for crystalline specimens from an inline hologramAndrew R Lupini, Stephen J PennycookMicroscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|August 1, 2012
Tuning fifth-order aberrations in a quadrupole-octupole correctorAndrew R Lupini, Stephen J PennycookNature Materials|November 2, 2004
Quasicrystals as cluster aggregatesEiji Abe, Yanfa Yan, Stephen J PennycookUltramicroscopy|December 31, 2011
Localization of inelastic electron scattering in the low-loss energy regimeWu Zhou, Stephen J Pennycook, Juan-Carlos IdroboPageof 30