Related Experiment Video
Updated: May 20, 2026
12:14
The Generation of Higher-order Laguerre-Gauss Optical Beams for High-precision Interferometry
Published on: August 12, 2013
Tuning fifth-order aberrations in a quadrupole-octupole corrector
Andrew R Lupini1, Stephen J Pennycook
1Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA. 9az@ornl.gov
Summary
This study introduces a fifth-order aberration corrector for scanning transmission electron microscopes. This advanced corrector reduces fourth- and fifth-order aberrations, improving electron microscope resolution.
Area of Science:
- Materials Science
- Physics
- Electron Microscopy
Background:
- Conventional electron microscopes face resolution limits due to spherical aberration.
- Aberration correctors reduce primary aberrations but are limited by higher-order, chromatic, and misalignment aberrations.
- Existing third-order correctors in advanced microscopes are limited by uncorrected fifth-order aberrations.
Purpose of the Study:
- To demonstrate the capability of a Nion fifth-order aberration corrector.
- To reduce specific fourth- and fifth-order aberrations in probe-corrected scanning transmission electron microscopes.
- To enhance the resolution and performance of advanced electron microscopes.
Main Methods:
- Utilized a Nion fifth-order aberration corrector.
- Applied sophisticated alignment software.
- Performed adjustments to reduce specific aberrations in a scanning transmission electron microscope.
Main Results:
- Successfully adjusted and reduced certain fourth-order aberrations.
- Successfully adjusted and reduced certain fifth-order aberrations.
- Demonstrated the effectiveness of the fifth-order corrector in mitigating higher-order aberrations.
Conclusions:
- The Nion fifth-order aberration corrector effectively addresses limitations imposed by higher-order aberrations.
- This technology offers a pathway to further improve the resolution of scanning transmission electron microscopes.
- Advanced aberration correction is crucial for pushing the boundaries of electron microscopy.
Related Concept Videos
01:19Mass Analyzers: Common Types
The quadrupole mass analyzer consists of four cylindrical metal rods arranged in a diamond carrying a DC voltage and a radio-frequency AC voltage. The motion of ions through the quadrupole depends on the field strength, causing only ions of a certain m/z to resonate successfully and strike the detector at a given field strength. Though the transmission rate for these analyzers is high, the exact elemental composition of the sample is not determined because of low resolution; however, they are...
01:14NMR Spectrometers: Resolution and Error Correction
When magnetic nuclei in a sample achieve resonance and undergo relaxation, the signal detected in NMR is an approximately exponential free induction decay. Fourier transform of an exponential decay yields a Lorentzian peak in the frequency domain. Lorentzian peaks in an NMR spectrum are defined by their amplitude, full width at half maximum, and position, where the peak width is governed by the spin-spin relaxation time alone. In real experiments, however, the applied magnetic field is rendered...
01:15Distance Corrections
To achieve precise distance measurements, especially in surveying and construction, certain corrections must be applied to account for potential sources of error like the standardization errors, temperature variations, and slope adjustments.Standardization error emerges when measurement equipment undergoes changes, such as wear, repairs, or weather impacts. To address this, surveyors compare the equipment’s readings to a standard. This process identifies any deviation that might lead to...
01:15Optimizing Chromatographic Separations
Optimizing chromatographic separations is crucial for obtaining clean separations in a minimum amount of time. Optimization is required for several factors, including kinetic effects related to band broadening, plate height, capacity factor, and separation factor.
Band broadening refers to spreading solute bands as they travel through the column. This broadening can impact resolution. Plate height (H) represents the length required for one theoretical plate. A lower plate height corresponds to...
Band broadening refers to spreading solute bands as they travel through the column. This broadening can impact resolution. Plate height (H) represents the length required for one theoretical plate. A lower plate height corresponds to...