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Optics Express
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November 23, 2021
Measurement uncertainty evaluation procedures and applications for various types of multichannel rotating-element spectroscopic ellipsometers
Yong Jai Cho, Won Chegal
Optics Letters
|
January 26, 2011
Fourier analysis for rotating-element ellipsometers
Yong Jai Cho, Won Chegal, Hyun Mo Cho
Optics Express
|
July 21, 2015
Universal evaluations and expressions of measuring uncertainty for rotating-element spectroscopic ellipsometers
Yong Jai Cho, Won Chegal, Jeong Pyo Lee, et al.
Optics Express
|
November 19, 2016
Universal evaluation of combined standard uncertainty for rotating-element spectroscopic ellipsometers
Yong Jai Cho, Won Chegal, Jeong Pyo Lee, et al.
Scientific Reports
|
November 27, 2025
Rotating compensator spectroscopic ellipsometry based on frequency division multiplexing with retardation calibration
Jongkyoon Park, Alexander Gliserin, Sukhyun Choi, et al.
Optics Express
|
November 24, 2011
Snapshot phase sensitive scatterometry based on double-channel spectral carrier frequency concept
Daesuk Kim, Hyunsuk Kim, Robert Magnusson, et al.
Journal of the Optical Society of America. A, Optics, Image Science, and Vision
|
December 11, 2013
Optimizing the precision of a multichannel three-polarizer spectroscopic ellipsometer
Won Chegal, Jeong Pyo Lee, Hyun Mo Cho, et al.
Optics Express
|
January 5, 2024
Geometric analysis algorithm based on a neural network with localized simulation data for nano-grating structure using Mueller matrix spectroscopic ellipsometry
Juwon Jung, Kibaek Kim, Junho Choi, et al.
Nanophotonics (Berlin, Germany)
|
February 20, 2025
Neural network-based analysis algorithm on Mueller matrix data of spectroscopic ellipsometry for the structure evaluation of nanogratings with various optical constants
Juwon Jung, Nagyeong Kim, Kibaek Kim, et al.
Optics Express
|
June 25, 2009
Angle-resolved annular data acquisition method for microellipsometry
Sang-Heon Ye, Soo Hyun Kim, Yoon Keun Kwak, et al.
Page
of 2
Search research articles
Search
Showing results (1-10 of 15) with videos related to
Sort By:
Page
of 2
Optics Express
|
November 23, 2021
Measurement uncertainty evaluation procedures and applications for various types of multichannel rotating-element spectroscopic ellipsometers
Yong Jai Cho, Won Chegal
Optics Letters
|
January 26, 2011
Fourier analysis for rotating-element ellipsometers
Yong Jai Cho, Won Chegal, Hyun Mo Cho
Optics Express
|
July 21, 2015
Universal evaluations and expressions of measuring uncertainty for rotating-element spectroscopic ellipsometers
Yong Jai Cho, Won Chegal, Jeong Pyo Lee, et al.
Optics Express
|
November 19, 2016
Universal evaluation of combined standard uncertainty for rotating-element spectroscopic ellipsometers
Yong Jai Cho, Won Chegal, Jeong Pyo Lee, et al.
Scientific Reports
|
November 27, 2025
Rotating compensator spectroscopic ellipsometry based on frequency division multiplexing with retardation calibration
Jongkyoon Park, Alexander Gliserin, Sukhyun Choi, et al.
Optics Express
|
November 24, 2011
Snapshot phase sensitive scatterometry based on double-channel spectral carrier frequency concept
Daesuk Kim, Hyunsuk Kim, Robert Magnusson, et al.
Journal of the Optical Society of America. A, Optics, Image Science, and Vision
|
December 11, 2013
Optimizing the precision of a multichannel three-polarizer spectroscopic ellipsometer
Won Chegal, Jeong Pyo Lee, Hyun Mo Cho, et al.
Optics Express
|
January 5, 2024
Geometric analysis algorithm based on a neural network with localized simulation data for nano-grating structure using Mueller matrix spectroscopic ellipsometry
Juwon Jung, Kibaek Kim, Junho Choi, et al.
Nanophotonics (Berlin, Germany)
|
February 20, 2025
Neural network-based analysis algorithm on Mueller matrix data of spectroscopic ellipsometry for the structure evaluation of nanogratings with various optical constants
Juwon Jung, Nagyeong Kim, Kibaek Kim, et al.
Optics Express
|
June 25, 2009
Angle-resolved annular data acquisition method for microellipsometry
Sang-Heon Ye, Soo Hyun Kim, Yoon Keun Kwak, et al.
Page
of 2