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Microscopy (Oxford, England)|August 1, 2014
Magnified pseudo-elemental map of atomic column obtained by Moiré method in scanning transmission electron microscopyYukihito Kondo, Eiji OkunishiJournal of Electron Microscopy|May 14, 2003
High-resolution ultrahigh-vacuum electron microscopy of helical gold nanowires: junction and thinning processYoshifumi Oshima, Yukihito Kondo, Kunio TakayanagiMicroscopy (Oxford, England)|March 10, 2015
Phase-contrast scanning transmission electron microscopyHiroki Minoda, Takayuki Tamai, Hirofumi Iijima, et al.Ultramicroscopy|September 8, 2012
Element discrimination in a hexagonal boron nitride nanosheet by aberration corrected transmission electron microscopyMasanori Mitome, Hidetaka Sawada, Yukihito Kondo, et al.Microscopy (Oxford, England)|February 8, 2013
Development of Cs and Cc correctors for transmission electron microscopyFumio Hosokawa, Hidetaka Sawada, Yukihito Kondo, et al.Microscopy (Oxford, England)|January 26, 2018
Development of a secondary electron energy analyzer for a transmission electron microscopeHideyuki Magara, Takeshi Tomita, Yukihito Kondo, et al.Nature Materials|February 15, 2011
Direct imaging of hydrogen-atom columns in a crystal by annular bright-field electron microscopyRyo Ishikawa, Eiji Okunishi, Hidetaka Sawada, et al.Journal of Electron Microscopy|April 22, 2010
New area detector for atomic-resolution scanning transmission electron microscopyNaoya Shibata, Yuji Kohno, Scott D Findlay, et al.Ultramicroscopy|September 24, 2011
Annular electron energy-loss spectroscopy in the scanning transmission electron microscopeGary Ruben, Michel Bosman, Adrian J D'Alfonso, et al.Journal of Electron Microscopy|April 10, 2009
Development of a multifunctional TEM specimen holder equipped with a piezodriving probe and a laser irradiation portDaisuke Shindo, Kodai Takahashi, Yasukazu Murakami, et al.Pageof 2