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Journal of Electron Microscopy|July 2, 2010
Dependence of beam broadening on detection angle in scanning transmission electron microtomographySohei Motoki, Takeshi Kaneko, Yoshitaka Aoyama, et al.Journal of Electron Microscopy|June 24, 2009
STEM imaging of 47-pm-separated atomic columns by a spherical aberration-corrected electron microscope with a 300-kV cold field emission gunHidetaka Sawada, Yasumasa Tanishiro, Nobuhiro Ohashi, et al.Nature Communications|January 2, 2025
2.5-dimensional covalent organic frameworksTomoki Kitano, Syunto Goto, Xiaohan Wang, et al.Journal of Electron Microscopy|January 21, 2011
Quantitative annular dark-field STEM images of a silicon crystal using a large-angle convergent electron probe with a 300-kV cold field-emission gunSuhyun Kim, Yoshifumi Oshima, Hidetaka Sawada, et al.Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|October 17, 2009
Ultrahigh-vacuum third-order spherical aberration (Cs) corrector for a scanning transmission electron microscopeKazutaka Mitsuishi, Masaki Takeguchi, Yukihito Kondo, et al.Journal of Electron Microscopy|June 29, 2010
Performance of low-voltage STEM/TEM with delta corrector and cold field emission gunTakeo Sasaki, Hidetaka Sawada, Fumio Hosokawa, et al.Journal of Electron Microscopy|April 22, 2010
Direct imaging of lithium atoms in LiV₂O₄ by spherical aberration-corrected electron microscopyYoshifumi Oshima, Hidetaka Sawada, Fumio Hosokawa, et al.Nature Chemistry|March 8, 2011
Visualizing and identifying single atoms using electron energy-loss spectroscopy with low accelerating voltageKazu Suenaga, Yuta Sato, Zheng Liu, et al.Ultramicroscopy|April 25, 2017
Electron ptychographic phase imaging of light elements in crystalline materials using Wigner distribution deconvolutionHao Yang, Ian MacLaren, Lewys Jones, et al.Journal of the American Chemical Society|August 14, 2025
sln-Topological Covalent Organic Frameworks with Shape Dimorphism and Dipolar RotorsXiaohan Wang, Syunto Goto, Takejiro Ogawa, et al.Pageof 2