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Updated: Jun 22, 2026

Picometer-Precision Atomic Position Tracking through Electron Microscopy
15:04

Picometer-Precision Atomic Position Tracking through Electron Microscopy

Published on: July 3, 2021

STEM imaging of 47-pm-separated atomic columns by a spherical aberration-corrected electron microscope with a 300-kV

Hidetaka Sawada1, Yasumasa Tanishiro, Nobuhiro Ohashi

  • 1Japan Science and Technology Agency, CREST, 5 Sanbancho, Chiyoda-ku, Tokyo, Japan. hsawada@jeol.co.jp

Journal of Electron Microscopy
|June 24, 2009
PubMed

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