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Optics Express
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December 28, 2019
Tilt metrology on rough dielectric surfaces using low coherence scanning interferometry
Chang-Yun Lee, Joonho You, Yunseok Kim
Ultramicroscopy
|
September 9, 2019
Significance of electrostatic interactions due to surface potential in piezoresponse force microscopy
Daehee Seol, Seunghun Kang, Changhyo Sun, et al.
Optics Express
|
November 26, 2008
Distance measurements by combined method based on a femtosecond pulse laser
Ki-Nam Joo, Yunseok Kim, Seung-Woo Kim
Advanced Science (Weinheim, Baden-Wurttemberg, Germany)
|
September 30, 2020
Recent Progress in the Nanoscale Evaluation of Piezoelectric and Ferroelectric Properties via Scanning Probe Microscopy
Owoong Kwon, Daehee Seol, Huimin Qiao, et al.
Optics Express
|
February 4, 2017
Large-aperture ground glass surface profile measurement using coherence scanning interferometry
Eundeok Bae, Yunseok Kim, Sanguk Park, et al.
Optics Express
|
April 8, 2010
Er-doped fiber comb with enhanced fceo S/N ratio using Tm:Ho-doped fiber
Yunseok Kim, Young-Jin Kim, Seungman Kim, et al.
Scientific Reports
|
February 1, 2017
Electrostatic-free piezoresponse force microscopy
Sungho Kim, Daehee Seol, Xiaoli Lu, et al.
Advanced Materials (Deerfield Beach, Fla.)
|
September 16, 2011
Nanostructured ferroelectrics: fabrication and structure-property relations
Hee Han, Yunseok Kim, Marin Alexe, et al.
Reports on Progress in Physics. Physical Society (Great Britain)
|
January 26, 2018
Surface-screening mechanisms in ferroelectric thin films and their effect on polarization dynamics and domain structures
Sergei V Kalinin, Yunseok Kim, Dillon D Fong, et al.
Optics Express
|
July 8, 2009
Er-doped fiber frequency comb with mHz relative linewidth
Yunseok Kim, Seungman Kim, Young-Jin Kim, et al.
Page
of 9
Search research articles
Search
Showing results (1-10 of 82) with videos related to
Sort By:
Page
of 9
Optics Express
|
December 28, 2019
Tilt metrology on rough dielectric surfaces using low coherence scanning interferometry
Chang-Yun Lee, Joonho You, Yunseok Kim
Ultramicroscopy
|
September 9, 2019
Significance of electrostatic interactions due to surface potential in piezoresponse force microscopy
Daehee Seol, Seunghun Kang, Changhyo Sun, et al.
Optics Express
|
November 26, 2008
Distance measurements by combined method based on a femtosecond pulse laser
Ki-Nam Joo, Yunseok Kim, Seung-Woo Kim
Advanced Science (Weinheim, Baden-Wurttemberg, Germany)
|
September 30, 2020
Recent Progress in the Nanoscale Evaluation of Piezoelectric and Ferroelectric Properties via Scanning Probe Microscopy
Owoong Kwon, Daehee Seol, Huimin Qiao, et al.
Optics Express
|
February 4, 2017
Large-aperture ground glass surface profile measurement using coherence scanning interferometry
Eundeok Bae, Yunseok Kim, Sanguk Park, et al.
Optics Express
|
April 8, 2010
Er-doped fiber comb with enhanced fceo S/N ratio using Tm:Ho-doped fiber
Yunseok Kim, Young-Jin Kim, Seungman Kim, et al.
Scientific Reports
|
February 1, 2017
Electrostatic-free piezoresponse force microscopy
Sungho Kim, Daehee Seol, Xiaoli Lu, et al.
Advanced Materials (Deerfield Beach, Fla.)
|
September 16, 2011
Nanostructured ferroelectrics: fabrication and structure-property relations
Hee Han, Yunseok Kim, Marin Alexe, et al.
Reports on Progress in Physics. Physical Society (Great Britain)
|
January 26, 2018
Surface-screening mechanisms in ferroelectric thin films and their effect on polarization dynamics and domain structures
Sergei V Kalinin, Yunseok Kim, Dillon D Fong, et al.
Optics Express
|
July 8, 2009
Er-doped fiber frequency comb with mHz relative linewidth
Yunseok Kim, Seungman Kim, Young-Jin Kim, et al.
Page
of 9