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Yvonne B Gerbig

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Scripta Materialia|June 22, 2016
In situ observations of Berkovich indentation induced phase transitions in crystalline silicon filmsYvonne B Gerbig, Chris A Michaels, Robert F Cook
The Review of Scientific Instruments|December 3, 2013
Accurate spring constant calibration for very stiff atomic force microscopy cantileversScott J Grutzik, Richard S Gates, Yvonne B Gerbig, et al.
Ultramicroscopy|March 4, 2016
Assessing strain mapping by electron backscatter diffraction and confocal Raman microscopy using wedge-indented SiLawrence H Friedman, Mark D Vaudin, Stephan J Stranick, et al.
Journal of Applied Physics|January 20, 2025
Two-dimensional strain-mapping by electron backscatter diffraction and confocal Raman spectroscopyAndrew J Gayle, Lawrence H Friedman, Ryan Beams, et al.
Pageof 1

Showing results (1-10 of 4) with videos related to

Sort By:
Pageof 1
Scripta Materialia|June 22, 2016
In situ observations of Berkovich indentation induced phase transitions in crystalline silicon filmsYvonne B Gerbig, Chris A Michaels, Robert F Cook
The Review of Scientific Instruments|December 3, 2013
Accurate spring constant calibration for very stiff atomic force microscopy cantileversScott J Grutzik, Richard S Gates, Yvonne B Gerbig, et al.
Ultramicroscopy|March 4, 2016
Assessing strain mapping by electron backscatter diffraction and confocal Raman microscopy using wedge-indented SiLawrence H Friedman, Mark D Vaudin, Stephan J Stranick, et al.
Journal of Applied Physics|January 20, 2025
Two-dimensional strain-mapping by electron backscatter diffraction and confocal Raman spectroscopyAndrew J Gayle, Lawrence H Friedman, Ryan Beams, et al.
Pageof 1