Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

Zhaowu Liu

Showing results (1-10 of 13) with videos related to

Pageof 2
Sort By:
Optics Letters|January 31, 2025
Elongating the focal depth of a Bessel beam by manipulating polarizationJingying Zhang, Wenhao Li, Wei Zhang, et al.
Optics Express|May 5, 2017
Precision measurement of X-axis stage mirror profile in scanning beam interference lithography by three-probe system based on bidirectional integration modelZhaowu Liu, Shan Jiang, Xiaotian Li, et al.
Applied Optics|May 3, 2019
Fast method to detect and calculate displacement errors in a Littrow grating-based interferometerQiang Lv, Zhaowu Liu, Wei Wang, et al.
Applied Optics|April 2, 2021
Method for exposure dose monitoring and control in scanning beam interference lithographyYing Song, Yujuan Liu, Shan Jiang, et al.
Applied Optics|July 2, 2020
Heterodyne period measurement in a scanning beam interference lithography systemShan Jiang, Bo Lü, Ying Song, et al.
Optics Express|October 7, 2021
Grating-based 2D displacement measurement with quadruple optical subdivision of a single incident beamYunfei Yin, Zhaowu Liu, Shan Jiang, et al.
Optics Express|September 15, 2023
Accurate measurement and adjustment method for interference fringe direction in a scanning beam interference lithography systemYubo Li, Shan Jiang, Xingshuo Chen, et al.
Scientific Reports|August 17, 2017
Two-color heterodyne laser interferometry for long-distance stage measurement with correction of uncertainties in measured optical distancesZhaowu Liu, Wenhao Li, Bayanheshig, et al.
Optics Express|November 11, 2022
Littrow 3D measurement based on 2D grating dual-channel equal-optical path interferenceYunfei Yin, Lin Liu, Yu Bai, et al.
Optics Express|February 25, 2022
Polarization-modulated grating interferometer by conical diffractionLin Liu, Zhaowu Liu, Shan Jiang, et al.
Pageof 2

Showing results (1-10 of 13) with videos related to

Sort By:
Pageof 2
Optics Letters|January 31, 2025
Elongating the focal depth of a Bessel beam by manipulating polarizationJingying Zhang, Wenhao Li, Wei Zhang, et al.
Optics Express|May 5, 2017
Precision measurement of X-axis stage mirror profile in scanning beam interference lithography by three-probe system based on bidirectional integration modelZhaowu Liu, Shan Jiang, Xiaotian Li, et al.
Applied Optics|May 3, 2019
Fast method to detect and calculate displacement errors in a Littrow grating-based interferometerQiang Lv, Zhaowu Liu, Wei Wang, et al.
Applied Optics|April 2, 2021
Method for exposure dose monitoring and control in scanning beam interference lithographyYing Song, Yujuan Liu, Shan Jiang, et al.
Applied Optics|July 2, 2020
Heterodyne period measurement in a scanning beam interference lithography systemShan Jiang, Bo Lü, Ying Song, et al.
Optics Express|October 7, 2021
Grating-based 2D displacement measurement with quadruple optical subdivision of a single incident beamYunfei Yin, Zhaowu Liu, Shan Jiang, et al.
Optics Express|September 15, 2023
Accurate measurement and adjustment method for interference fringe direction in a scanning beam interference lithography systemYubo Li, Shan Jiang, Xingshuo Chen, et al.
Scientific Reports|August 17, 2017
Two-color heterodyne laser interferometry for long-distance stage measurement with correction of uncertainties in measured optical distancesZhaowu Liu, Wenhao Li, Bayanheshig, et al.
Optics Express|November 11, 2022
Littrow 3D measurement based on 2D grating dual-channel equal-optical path interferenceYunfei Yin, Lin Liu, Yu Bai, et al.
Optics Express|February 25, 2022
Polarization-modulated grating interferometer by conical diffractionLin Liu, Zhaowu Liu, Shan Jiang, et al.
Pageof 2