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Optics Express
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February 18, 2026
Paralleled needle-like-beam image scanning microscopy for fast volumetric super-resolution imaging
Zizhen Jiang, Mengjiao Nie, Huiqun Cao, et al.
Optics Letters
|
March 14, 2025
Resolution-enhanced multifocal structured illumination microscopy using fluorescence fluctuations and Fourier ptychography scheme
Bin Yu, Mengjiao Nie, Zizhen Jiang, et al.
Nature Communications
|
September 26, 2015
Metal oxide-resistive memory using graphene-edge electrodes
Seunghyun Lee, Joon Sohn, Zizhen Jiang, et al.
Optics Express
|
September 23, 2025
Zero-shot learning for denoising and super-resolution in multifocal structured illumination microscopy
Zizhen Jiang, Fuhong Han, Mengjiao Nie, et al.
Nanotechnology
|
October 24, 2013
Experimental study of plane electrode thickness scaling for 3D vertical resistive random access memory
Hong-Yu Chen, Shimeng Yu, Bin Gao, et al.
Nanotechnology
|
April 21, 2016
Disturbance characteristics of half-selected cells in a cross-point resistive switching memory array
Zhe Chen, Haitong Li, Hong-Yu Chen, et al.
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of 1
Search research articles
Search
Showing results (1-10 of 6) with videos related to
Sort By:
Page
of 1
Optics Express
|
February 18, 2026
Paralleled needle-like-beam image scanning microscopy for fast volumetric super-resolution imaging
Zizhen Jiang, Mengjiao Nie, Huiqun Cao, et al.
Optics Letters
|
March 14, 2025
Resolution-enhanced multifocal structured illumination microscopy using fluorescence fluctuations and Fourier ptychography scheme
Bin Yu, Mengjiao Nie, Zizhen Jiang, et al.
Nature Communications
|
September 26, 2015
Metal oxide-resistive memory using graphene-edge electrodes
Seunghyun Lee, Joon Sohn, Zizhen Jiang, et al.
Optics Express
|
September 23, 2025
Zero-shot learning for denoising and super-resolution in multifocal structured illumination microscopy
Zizhen Jiang, Fuhong Han, Mengjiao Nie, et al.
Nanotechnology
|
October 24, 2013
Experimental study of plane electrode thickness scaling for 3D vertical resistive random access memory
Hong-Yu Chen, Shimeng Yu, Bin Gao, et al.
Nanotechnology
|
April 21, 2016
Disturbance characteristics of half-selected cells in a cross-point resistive switching memory array
Zhe Chen, Haitong Li, Hong-Yu Chen, et al.
Page
of 1