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IEEE Transactions on Pattern Analysis and Machine Intelligence|October 30, 2025
NVS-SQA: Exploring Self-Supervised Quality Representation Learning for Neurally Synthesized Scenes without ReferencesQiang Qu, Yiran Shen, Xiaoming Chen, et al.
IEEE Transactions on Pattern Analysis and Machine Intelligence|October 31, 2025
Structural Similarity in Deep Features: Unified Image Quality Assessment Robust to Geometrically Disparate ReferenceKeke Zhang, Weiling Chen, Tiesong Zhao, et al.
IEEE Transactions on Pattern Analysis and Machine Intelligence|October 31, 2025
SED++: A Simple Encoder-Decoder for Improved Open-Vocabulary Semantic SegmentationWenqi Zhu, Bin Xie, Jiale Cao, et al.
IEEE Transactions on Pattern Analysis and Machine Intelligence|November 4, 2025
FlexPara: Flexible Neural Surface ParameterizationYuming Zhao, Qijian Zhang, Junhui Hou, et al.
IEEE Transactions on Pattern Analysis and Machine Intelligence|November 5, 2025
SelaVPR++: Towards Seamless Adaptation of Foundation Models for Efficient Place RecognitionFeng Lu, Tong Jin, Xiangyuan Lan, et al.
IEEE Transactions on Pattern Analysis and Machine Intelligence|November 3, 2025
Topo4D++: Realistic Physically Based 4D Head Capture with Topology-Preserving Gaussian Splatting and Expression PriorsYuhao Cheng, Xuanchen Li, Xingyu Ren, et al.
IEEE Transactions on Pattern Analysis and Machine Intelligence|July 7, 2025
DreamWaltz-G: Expressive 3D Gaussian Avatars from Skeleton-Guided 2D DiffusionYukun Huang, Jianan Wang, Ailing Zeng, et al.
IEEE Transactions on Pattern Analysis and Machine Intelligence|July 8, 2025
Gradient Projection For Continual Parameter- Efficient TuningJingyang Qiao, Zhizhong Zhang, Xin Tan, et al.
IEEE Transactions on Pattern Analysis and Machine Intelligence|July 15, 2025
ClusMatch: Improving Deep Clustering by Unified Positive and Negative Pseudo-label LearningJianlong Wu, Zihan Li, Wei Sun, et al.
IEEE Transactions on Pattern Analysis and Machine Intelligence|July 16, 2025
Scalable Random Feature Latent Variable ModelsYing Li, Zhidi Lin, Yuhao Liu, et al.
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