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Journal of X-Ray Science and Technology|February 11, 2011
An Elliptical Crystal Spectrometer Suitable for EXAFS Studies of Laser Compressed Materials and for High Resolution X-Ray SpectroscopyA Ridgeley, D Goodman, T A HallJournal of X-Ray Science and Technology|February 11, 2011
Subnanosecond In-Line Soft X-Ray Holography Using Germanium Laser in the 20 nm Wavelength RegionH Daido, M S Schulz, K Murai, et al.Journal of X-Ray Science and Technology|February 11, 2011
Theoretical and experimental investigation of x-ray diffraction by a lamellar multilayer amplitude gratingS Bac, P Troussel, A Sammar, et al.Journal of X-Ray Science and Technology|February 11, 2011
Production of ultra thin silicon foilsR Medenwaldt, M HettwerJournal of X-Ray Science and Technology|February 11, 2011
Ray tracing for crystal-diffraction spectrometers with position-sensitive detectorsU Lehnert, G ZschornackJournal of X-Ray Science and Technology|February 11, 2011
X-UV Index of Refraction of Dense and Hot PlasmasR Benattar, C Galos, P NeyJournal of X-Ray Science and Technology|February 11, 2011
Long-Duration Soft X-Ray Pulses by XeCl Laser Driven Plasmas and ApplicationsS Bollanti, P Di Lazzaro, F Flora, et al.Journal of X-Ray Science and Technology|February 11, 2011
Thermal Stability of Normal Incidence Multilayer Mirrors for the X-Ray Wavelength near Carbon K-EdgeE A Bugaev, A I Fedorenko, V V Kondratenko, et al.Journal of X-Ray Science and Technology|February 11, 2011
Bragg x-ray optics for imaging spectroscopy of plasma microsourcesT A Pikuz, A Ya Faenov, S A Pikuz, et al.Journal of X-Ray Science and Technology|February 11, 2011
Enhanced X-Ray Detectors Using Polar Dopants for KCD Digital RadiographyG C Giakos, S Devidas, B Pillai, et al.Pageof 139