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Journal of X-Ray Science and Technology|May 25, 2011
A 2D multiresolution image reconstruction method in X-ray computed tomographyMarius Costin, Delphine Lazaro-Ponthus, Samuel Legoupil, et al.Journal of X-Ray Science and Technology|February 11, 2011
Charge Coupled Device (CCD) Area Detector for On-Line (40- to 80-ms) Acquisition of Laue Diffraction Data from Protein CrystalsN M Allinson, R Brammer, J R Helliwell, et al.Journal of X-Ray Science and Technology|February 11, 2011
Design and Characterization of X-Ray Multilayer Analyzers for the 50-1000 eV RegionB L Henke, E M Gullikson, J Kerner, et al.Journal of X-Ray Science and Technology|February 11, 2011
X-Ray Microscopy at Suboptical Resolution: Direct Observation of the 65-nm Periodicity in Collagen FibrilsR E Burge, C J Buckley, G F Foster, et al.Journal of X-Ray Science and Technology|February 11, 2011
Flux maximization techniques for compton backscatter depth profilometryL LawsonJournal of X-Ray Science and Technology|February 11, 2011
Interference Suppression of X-Ray Scattering under Total External Reflection from Rough SurfacesA Yu Karabekov, I V Kozhevnikov, V E FedyukovichJournal of X-Ray Science and Technology|February 11, 2011
Large-area pressure-enduring entrance windows for soft x-ray regimeR Mutikainen, V P Viitanen, S NenonenJournal of X-Ray Science and Technology|February 11, 2011
The New NIST/ARPA National Soft X-Ray Reflectometry FacilityC Tarrio, R N Watts, T B Lucatorto, et al.Journal of X-Ray Science and Technology|February 11, 2011
Diffraction-limited large x-ray opticsE SpillerJournal of X-Ray Science and Technology|February 11, 2011
Application of graphite mosaic monochromator crystals for x-ray transportP A TompkinsPageof 139