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Journal of X-Ray Science and Technology|February 11, 2011
Power loading limitations in soft x-ray projection lithographyA M Hawryluk, N M CeglioJournal of X-Ray Science and Technology|February 11, 2011
The effect of linear interpolation of the filtered projections on image noise in x-ray computed tomographyG R DavisJournal of X-Ray Science and Technology|February 11, 2011
ReflEXAFS Spectroscopy of Thin Fe/Sc MultilayersY V Ponomarev, A B Palkin, A B Savel'ev, et al.Journal of X-Ray Science and Technology|February 11, 2011
Whispering gallery mirrors for the soft x-ray region: properties and applicationsI N Bukreeva, I V Kozhevnikov, A V VinogradovJournal of X-Ray Science and Technology|February 11, 2011
Luminosity of bragg crystal diffraction spectrometers with flat and focusing crystalsU Lehnert, G ZschornackJournal of X-Ray Science and Technology|February 11, 2011
Effects of the microstructuring process on diffraction properties of bragg-fresnel lensesY M Hartman, V A Yunkin, A A SnigirevJournal of X-Ray Science and Technology|February 11, 2011
The X-Ray CCDs Developed for the Joint European X-Ray TelescopeA Owens, A F Abbey, H Brauninger, et al.Journal of X-Ray Science and Technology|February 11, 2011
X-ray diffraction imaging using perfect crystalsT J DavisJournal of X-Ray Science and Technology|February 11, 2011
X-Ray Focusing Optics and Its Applications in XRMF and XRLY Yan, X Ding, D Wang, et al.Journal of X-Ray Science and Technology|February 11, 2011
X-Ray Interferometry at ESRF Using Two Coherent Beams from Fresnel MirrorsK Fezzaa, F Comin, S Marchesini, et al.Pageof 138