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Journal of X-Ray Science and Technology|February 11, 2011
Plasma x-ray radiation sourceN F Popkov, V I Kargin, E A Ryaslov, et al.Journal of X-Ray Science and Technology|February 11, 2011
Structural Changes Study of Co/C and Ni/C Multilayers upon AnnealingV A Chernov, N I Chkhalo, M V Fedorchenko, et al.Journal of X-Ray Science and Technology|February 11, 2011
The Structure of W/C (0.15 < γ < 0.8) Multilayers Annealed in Argon or AirJ Gonzalez-Hernandez, B S Chao, S R Ovshinsky, et al.Journal of X-Ray Science and Technology|February 11, 2011
Line spread function study of kinestatic charge detectors operating at high gas pressuresG C Giakos, P Ghotra, B Pillai, et al.Journal of X-Ray Science and Technology|February 11, 2011
Calibrated time-resolved transmission grating spectrometer for the study of ultrafast x-ray sourcesJ F Pelletier, M Chaker, J C KiefferJournal of X-Ray Science and Technology|February 11, 2011
Anecdotes about the Early Days of X-Ray OpticsA V BaezJournal of X-Ray Science and Technology|February 11, 2011
Silicon drift detectors with on-chip electronics for x-ray spectroscopyC Fiorini, A Longoni, R Hartmann, et al.Journal of X-Ray Science and Technology|February 11, 2011
New Concepts for X-Ray, Soft X-Ray, and EUV Optical Instrumentation Including Applications in Spectroscopy, Plasma Diagnostics, and Biomedical Microscopy: A Status ReportV L Kantsyrev, R Bruch, R Phaneuf, et al.Journal of X-Ray Science and Technology|February 11, 2011
Time-Resolved, Multi-frame X-Ray Imaging of Laser-Produced PlasmasL A Gizzi, A Giulietti, O WilliJournal of X-Ray Science and Technology|February 11, 2011
Synchrotron white beam topographic imaging in grazing bragg-laue geometriesG D Yao, M Dudley, J WuPageof 139