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Journal of Applied Crystallography|April 10, 2023
An inclined detector geometry for improved X-ray total scattering measurementsNicholas Burns, Aly Rahemtulla, Scott Annett, et al.Journal of Applied Crystallography|April 10, 2023
Use of electron backscatter diffraction patterns to determine the crystal lattice. Part 2. Offset correctionsGert Nolze, Tomasz Tokarski, Łukasz RychłowskiJournal of Applied Crystallography|April 9, 2021
The XBI BioLab for life science experiments at the European XFELHuijong Han, Ekaterina Round, Robin Schubert, et al.Journal of Applied Crystallography|April 9, 2021
Concepts for nondestructive and depth-resolved X-ray residual stress analysis in the near-surface region of nearly single crystalline materials with mosaic structureAndreas Hollmann, Matthias Meixner, Manuela Klaus, et al.Journal of Applied Crystallography|April 9, 2021
Energy-dispersive X-ray micro Laue diffraction on a bent gold nanowireAli AlHassan, A Abboud, T W Cornelius, et al.Journal of Applied Crystallography|April 9, 2021
On the determination of residual stresses in additively manufactured lattice structuresTobias Fritsch, Maximilian Sprengel, Alexander Evans, et al.Journal of Applied Crystallography|April 9, 2021
Elastic stiffness coefficients of thiourea from thermal diffuse scatteringJulia Büscher, Alessandro Mirone, Michał Stękiel, et al.Journal of Applied Crystallography|April 9, 2021
Controlled sample environment for studying solid-gas interactions by in situ powder X-ray diffractionPaul Monceyron Røren, Kristoffer W B Hunvik, Vegard Josvanger, et al.Journal of Applied Crystallography|June 7, 2014
An improved method for calibrating time-of-flight Laue single-crystal neutron diffractometersCraig L Bull, Michael W Johnson, Hayrullo Hamidov, et al.Pageof 112