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Journal of Applied Crystallography|August 6, 2025
How X-ray dark-field imaging relates to small-angle X-ray scattering measurementsClara Magnin, Manuel Fernández Martínez, Dan Mihai Cenda, et al.Journal of Applied Crystallography|September 19, 2013
Three-wave X-ray diffraction in distorted epitaxial structuresReginald Kyutt, Mikhail ScheglovJournal of Applied Crystallography|September 19, 2013
X-ray characterization of Ge dots epitaxially grown on nanostructured Si islands on silicon-on-insulator substratesPeter Zaumseil, Grzegorz Kozlowski, Yuji Yamamoto, et al.Journal of Applied Crystallography|September 19, 2013
Grazing-incidence X-ray diffraction of single GaAs nanowires at locations defined by focused ion beamsGenziana Bussone, Rüdiger Schott, Andreas Biermanns, et al.Journal of Applied Crystallography|September 19, 2013
Alloy formation during molecular beam epitaxy growth of Si-doped InAs nanowires on GaAs[111]BAnton Davydok, Torsten Rieger, Andreas Biermanns, et al.Journal of Applied Crystallography|September 19, 2013
Characterization of SiGe thin films using a laboratory X-ray instrumentTatjana Ulyanenkova, Maksym Myronov, Andrei Benediktovitch, et al.Journal of Applied Crystallography|September 19, 2013
Covariant description of X-ray diffraction from anisotropically relaxed epitaxial structuresA Zhylik, A Benediktovitch, I Feranchuk, et al.Journal of Applied Crystallography|September 19, 2013
A prototype direct-detection CCD for protein crystallographyKatherine S Green, Doletha M E Szebenyi, Kasey Boggs, et al.Journal of Applied Crystallography|May 18, 2013
CCL: an algorithm for the efficient comparison of clustersR Hundt, J C Schön, S Neelamraju, et al.Journal of Applied Crystallography|February 12, 2013
A high-pressure cryocooling method for protein crystals and biological samples with reduced background X-ray scatterChae Un Kim, Jennifer L Wierman, Richard Gillilan, et al.Pageof 112