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Journal of Electron Microscopy|December 8, 2004
Behaviors of surfactant atoms on Si(001) surfaceHirofumi Matsuhata, Kunihiro Sakamoto, Kazushi Miki
Journal of Electron Microscopy|December 8, 2004
In situ ESEM observation of melting silver and Inconel on an Al(2)O(3) powder bedSimon Fischer, Katja Lemster, Ralf Kaegi, et al.
Journal of Electron Microscopy|December 8, 2004
Improvements in performance of focused ion beam cross-sectioning: aspects of ion-sample interactionTohru Ishitani, Kaoru Umemura, Tsuyoshi Ohnishi, et al.
Journal of Electron Microscopy|December 8, 2004
A review of focused ion beam technology and its applications in transmission electron microscopyMasaaki Sugiyama, Genichi Sigesato
Journal of Electron Microscopy|December 8, 2004
Plan-view and cross-sectional characterization of thiourea-treated phosphorus-added steel surfaceKaoru Sato, Michitaka Sakurai, Shoichiro Taira, et al.
Journal of Electron Microscopy|December 8, 2004
Application of a FIB-STEM system for 3D observation of a resin-embedded yeast cellTakeo Kamino, Toshie Yaguchi, Tsuyoshi Ohnishi, et al.
Journal of Electron Microscopy|January 1, 2004
Quantitative analysis of static capacitance contrast in scanning electron microscopyRen-Jian Feng, Hai-Bo Zhang, Katsumi Ura
Journal of Electron Microscopy|January 1, 2004
Remineralization effects of xylitol on demineralized enamelYasuo Miake, Yoji Saeki, Mitsuru Takahashi, et al.
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