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Journal of Electron Microscopy|May 14, 2003
High-resolution ultrahigh-vacuum electron microscopy of helical gold nanowires: junction and thinning processYoshifumi Oshima, Yukihito Kondo, Kunio TakayanagiJournal of Electron Microscopy|May 14, 2003
Radiation-induced segregation and precipitation behaviours around cascade clusters under electron irradiationYuichiro Sueishi, Norihito Sakaguchi, Tamaki Shibayama, et al.Journal of Electron Microscopy|July 19, 2003
A practical method for the remote control of the scanning electron microscopeAtsushi Yamada, Osamu Hirahara, Takayoshi Tsuchida, et al.Journal of Electron Microscopy|July 19, 2003
Quantitative three-dimensional structural analysis of Exophiala dermatitidis yeast cells by freeze-substitution and serial ultrathin sectioningSondip Kumar Biswas, Masashi Yamaguchi, Norihide Naoe, et al.Journal of Electron Microscopy|July 19, 2003
In situ localization of cell wall alpha-1,3-glucan in the fission yeast Schizosaccharomyces pombeTomoko Sugawara, Mamiko Sato, Tomoko Takagi, et al.Journal of Electron Microscopy|August 2, 2003
Characterization of polymer-adhesive interfaces on a nanometre scale by elemental mapping and image EELS using EFTEMShin Horiuchi, Tadashi Hamanaka, Takashi Aoki, et al.Journal of Electron Microscopy|October 1, 1992
Distribution of filipin-sterol complexes in the bloodstream form of Trypanosoma brucei gambienseH Yoshikawa, J Furuki, Y Takahashi, et al.Journal of Electron Microscopy|August 27, 2005
Calibration of projector lens distortionsF Hüe, C L Johnson, S Lartigue-Korinek, et al.Journal of Electron Microscopy|February 8, 2005
Effects of micafungin on the morphology of Aspergillus fumigatusYayoi Nishiyama, Yayoi Hasumi, Kumiko Ueda, et al.Journal of Electron Microscopy|August 31, 2004
Contrast-to-gradient method for the evaluation of image resolution taking account of random noise in scanning electron microscopyTohru Ishitani, Mitsugu SatoPageof 116