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Journal of Electron Microscopy|April 1, 1992
An EDTA-KOH method to expose bone cells for scanning electron microscopyK Abe, H Hashizume, T Ushiki
Journal of Electron Microscopy|April 14, 2004
Structural analyses by TEM of iridium deposited on TiO2 powder and rutile single crystalTomoki Akita, Mitsutaka Okumura, Koji Tanaka, et al.
Journal of Electron Microscopy|April 14, 2004
Electron holography on remanent magnetization distribution of melt-spun Nd-Fe-B magnetsYoung-Gil Park, Daisuke Shindo
Journal of Electron Microscopy|April 14, 2004
Application of real-time confocal laser scanning microscopy to observe living cells in tissue specimensTomoyuki Saino, Yoh-ichi Satoh
Journal of Electron Microscopy|December 8, 2004
Separation of linear and non-linear imaging components in high-resolution transmission electron microscope imagesTsunenori Nomaguchi, Tadahiro Kawasaki, Yoshihide Kimura, et al.
Journal of Electron Microscopy|December 8, 2004
HVEM characterization of crack tip dislocations in silicon crystalsMasaki Tanaka, Kenji Higashida
Journal of Electron Microscopy|December 8, 2004
Bandgap mapping for III-V quantum well by electron spectroscopy imagingJin-Sheng Tsai, Ji-Jung Kai, Li Chang, et al.
Journal of Electron Microscopy|December 8, 2004
Focused ion beam fabrication of field-ion microscope specimens from mechanically milled pearlitic steel powderSatoru Ohsaki, Kazuhiro Hono, Hideyuki Hidaka, et al.
Journal of Electron Microscopy|December 8, 2004
Microsampling technique for EBSP inspection on the cross-sections of copper trench lines in ULSIsYukinori Hirose, Naoto Hashikawa, Koji Fukumoto, et al.
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