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Journal of Electron Microscopy|June 12, 2010
Prospects for 3D imaging of dopant atoms in ceramic interfacesScott D Findlay, Naoya Shibata, Shinya Azuma, et al.Journal of Electron Microscopy|April 14, 2004
Lattice parameter determination of a strained area of an InAs layer on a GaAs substrate using CBEDTakayuki Akaogi, Kenji Tsuda, Masami Terauchi, et al.Journal of Electron Microscopy|March 29, 2002
Identification of various phases in HRTEM images of MgO-PSZZ Liu, A E SpargoJournal of Electron Microscopy|May 14, 2003
Creep deformation of grain boundary in a highly crystalline SiC fibreTamaki Shibayama, Yutaka Yoshida, Yasuhide Yano, et al.Journal of Electron Microscopy|October 24, 2007
Formation of crystalline silicon in kaolinite by electron beam irradiation and in situ heating in the HVEMSujeong Lee, Young-Min Kim, Youn-Joong KimJournal of Electron Microscopy|October 12, 2007
Strain analysis of arsenic-doped silicon using CBED rocking curves of low-order reflectionsKenji Tsuda, Hajime Mitsuishi, Masami Terauchi, et al.Journal of Electron Microscopy|December 7, 2000
Microstructure of Cu(x)Mo6S8 Chevrel phase thin films on R-plane sapphireRichard, Van Tendeloo G, Lemee, et al.Journal of Electron Microscopy|April 1, 1996
Microinfusion method using barium sulfate for visualization of embryonic blood vessels with light and scanning electron microscopyS KondoJournal of Electron Microscopy|August 17, 2011
Topics in recent studies with high-voltage electron microscopesHirotaro MoriJournal of Electron Microscopy|August 17, 2011
New views of materials through aberration-corrected scanning transmission electron microscopyS J Pennycook, M VarelaPageof 116