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Journal of Electron Microscopy
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December 8, 2004
Improvements in performance of focused ion beam cross-sectioning: aspects of ion-sample interaction
Tohru Ishitani, Kaoru Umemura, Tsuyoshi Ohnishi, et al.
Journal of Electron Microscopy
|
December 8, 2004
A review of focused ion beam technology and its applications in transmission electron microscopy
Masaaki Sugiyama, Genichi Sigesato
Journal of Electron Microscopy
|
December 8, 2004
Plan-view and cross-sectional characterization of thiourea-treated phosphorus-added steel surface
Kaoru Sato, Michitaka Sakurai, Shoichiro Taira, et al.
Journal of Electron Microscopy
|
December 8, 2004
Application of a FIB-STEM system for 3D observation of a resin-embedded yeast cell
Takeo Kamino, Toshie Yaguchi, Tsuyoshi Ohnishi, et al.
Journal of Electron Microscopy
|
January 1, 2004
Quantitative analysis of static capacitance contrast in scanning electron microscopy
Ren-Jian Feng, Hai-Bo Zhang, Katsumi Ura
Journal of Electron Microscopy
|
January 1, 2004
Remineralization effects of xylitol on demineralized enamel
Yasuo Miake, Yoji Saeki, Mitsuru Takahashi, et al.
Journal of Electron Microscopy
|
April 1, 1992
An EDTA-KOH method to expose bone cells for scanning electron microscopy
K Abe, H Hashizume, T Ushiki
Journal of Electron Microscopy
|
April 1, 1992
Effects of phalloidin on the epithelial regeneration in the mouse gastric mucosa
Y Jinguji
Journal of Electron Microscopy
|
April 14, 2004
Structural analyses by TEM of iridium deposited on TiO2 powder and rutile single crystal
Tomoki Akita, Mitsutaka Okumura, Koji Tanaka, et al.
Journal of Electron Microscopy
|
April 14, 2004
Electron holography on remanent magnetization distribution of melt-spun Nd-Fe-B magnets
Young-Gil Park, Daisuke Shindo
Page
of 116
Search research articles
Search
Showing results (571-580 of 1,155) with videos related to
Sort By:
Page
of 116
Journal of Electron Microscopy
|
December 8, 2004
Improvements in performance of focused ion beam cross-sectioning: aspects of ion-sample interaction
Tohru Ishitani, Kaoru Umemura, Tsuyoshi Ohnishi, et al.
Journal of Electron Microscopy
|
December 8, 2004
A review of focused ion beam technology and its applications in transmission electron microscopy
Masaaki Sugiyama, Genichi Sigesato
Journal of Electron Microscopy
|
December 8, 2004
Plan-view and cross-sectional characterization of thiourea-treated phosphorus-added steel surface
Kaoru Sato, Michitaka Sakurai, Shoichiro Taira, et al.
Journal of Electron Microscopy
|
December 8, 2004
Application of a FIB-STEM system for 3D observation of a resin-embedded yeast cell
Takeo Kamino, Toshie Yaguchi, Tsuyoshi Ohnishi, et al.
Journal of Electron Microscopy
|
January 1, 2004
Quantitative analysis of static capacitance contrast in scanning electron microscopy
Ren-Jian Feng, Hai-Bo Zhang, Katsumi Ura
Journal of Electron Microscopy
|
January 1, 2004
Remineralization effects of xylitol on demineralized enamel
Yasuo Miake, Yoji Saeki, Mitsuru Takahashi, et al.
Journal of Electron Microscopy
|
April 1, 1992
An EDTA-KOH method to expose bone cells for scanning electron microscopy
K Abe, H Hashizume, T Ushiki
Journal of Electron Microscopy
|
April 1, 1992
Effects of phalloidin on the epithelial regeneration in the mouse gastric mucosa
Y Jinguji
Journal of Electron Microscopy
|
April 14, 2004
Structural analyses by TEM of iridium deposited on TiO2 powder and rutile single crystal
Tomoki Akita, Mitsutaka Okumura, Koji Tanaka, et al.
Journal of Electron Microscopy
|
April 14, 2004
Electron holography on remanent magnetization distribution of melt-spun Nd-Fe-B magnets
Young-Gil Park, Daisuke Shindo
Page
of 116