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Journal of Microscopy|December 12, 2019
Application of automated electron microscopy imaging and machine learning to characterise and quantify nanoparticle dispersion in aqueous mediaM Ilett, J Wills, P Rees, et al.Journal of Microscopy|March 6, 2018
Second-harmonic imaging microscopy for identifying colorectal intraepithelial neoplasiaL H Li, W Z Jiang, D Y Kang, et al.Journal of Microscopy|January 24, 2023
Addressing multiscale microbial challenges using the MesolensLiam M Rooney, Beatrice Bottura, Katherine Baxter, et al.Journal of Microscopy|April 12, 2001
Microfabricated silicon dioxide cantilever with subwavelength apertureY Mitsuoka, T Niwa, S Ichihara, et al.Journal of Microscopy|April 12, 2001
Moulded photoplastic probes for near-field optical applicationsB J Kim, J W Flamma, E S Ten Have, et al.Journal of Microscopy|April 12, 2001
High-resolution constant-height imaging with apertured silicon cantilever probesT Dziomba, H U Danzebrink, C Lehrer, et al.Journal of Microscopy|April 12, 2001
Non-regularly shaped plasmon resonant nanoparticle as localized light source for near-field microscopyJ P Kottmann, O J Martin, D R Smith, et al.Journal of Microscopy|April 12, 2001
Optical near-field harmonic demodulation in apertureless microscopyN Maghelli, M Labardi, S Patanè, et al.Journal of Microscopy|April 12, 2001
Tapping-mode tuning-fork near-field scanning optical microscopy of low power semiconductor lasersN H Lu, W C Lin, D P TsaiJournal of Microscopy|April 12, 2001
Femtosecond near-field spectroscopy: carrier relaxation and transport in single quantum wiresV Emiliani, T Guenther, C Lienau, et al.Pageof 485