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Journal of Microscopy|November 19, 2020
Comparing Xe+ pFIB and Ga+ FIB for TEM sample preparation of Al alloys: Minimising FIB-induced artefactsXiangli Zhong, C Austin Wade, Philip J Withers, et al.Journal of Microscopy|November 20, 2020
Evaluation and application of a new scintillator-based heat-resistant back-scattered electron detector during heat treatment in the scanning electron microscopeR Podor, J Mendonça, J Lautru, et al.Journal of Microscopy|September 5, 2020
Erythrocyte viscoelastic recovery after liver transplantation in a cirrhotic patient affected by spur cell anaemiaM Leo, F DI Giacinto, M Nardini, et al.Journal of Microscopy|November 16, 2020
Site-specific specimen preparation for SIMS analysis of radioactive samplesJunliang Liu, Kexue Li, Sergio Lozano-Perez, et al.Journal of Microscopy|November 7, 2019
Image scanning difference microscopyYuchen Chen, Shaocong Liu, Chengfeng Zhang, et al.Journal of Microscopy|November 8, 2019
Morphology and kinetics of asphalt binder microstructure at gas, liquid and solid interfacesA Ramm, M C Downer, N Sakib, et al.Journal of Microscopy|November 9, 2019
Applications of X-ray computed tomography for the evaluation of biomaterial-mediated bone regeneration in critical-sized defectsM Peña Fernández, F Witte, G TozziJournal of Microscopy|March 7, 2020
Optimising adjacent membrane segmentation and parameterisation in multicellular aggregates by piecewise active contoursJ Jara-Wilde, I Castro, C G Lemus, et al.Journal of Microscopy|August 18, 2017
Enhanced EDX images by fusion of multimodal SEM images using pansharpening techniquesG Franchi, J Angulo, M Moreaud, et al.Pageof 486