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Journal of Microscopy|June 24, 2025
Background Remover - An effective tool for processing noisy microscopy imagesA Kilian, P Bilski, M SankowskaJournal of Microscopy|June 13, 2025
Macroscopic and microscopic electron transfer kinetics of HOPG and graphite intercalated compound investigated by cyclic voltammetry and SECMRossella Yivlialin, Gregorio Bonazza, Dario Battistel, et al.Journal of Microscopy|June 10, 2025
Artificial intelligence-powered microscopy: Transforming the landscape of parasitologyMariana De Niz, Sara Silva Pereira, David Kirchenbuechler, et al.Journal of Microscopy|June 23, 2025
Virtual dissection of Aedes aegypti mosquito using phase-contrast synchrotron microtomographyGabriela Sena, Thaina Alvarenga, Ruan Ingliton Feio, et al.Journal of Microscopy|May 31, 2025
Optimisation of EBSD indexing through pattern centre calibration and grain boundary refinementYiling Huang, Fan Peng, Xuemei Song, et al.Journal of Microscopy|February 19, 2024
GaN atomic electric fields from a segmented STEM detector: Experiment and simulationTim Grieb, Florian F Krause, Thorsten Mehrtens, et al.Journal of Microscopy|February 24, 2024
Investigations on lightweight concrete by in situ compression tests using high-resolution computed tomography (μ-CT)Cristin Umbach, Bernhard MiddendorfJournal of Microscopy|February 29, 2024
Comparison of the SMLM technique and the MSSR algorithm in confocal microscopy for super-resolved imaging of cellulose fibresJosué David Hernández-Varela, Susana Dianey Gallegos-Cerda, José Jorge Chanona-Pérez, et al.Journal of Microscopy|March 14, 2024
Measuring coefficient of thermal expansion of materials of micrometre size using SEM/FIB microscope with in situ MEMS heating stageStuart Robertson, Andrew McClintock, Kenny Jolley, et al.Journal of Microscopy|January 15, 2024
A multiangle polarised imaging-based method for thin section segmentationYan Chen, Yu Yi, Yongfang Dai, et al.Pageof 486