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Journal of Microscopy|March 31, 2004
Linear phase imaging using differential interference contrast microscopyM R Arnison, K G Larkin, C J R Sheppard, et al.
Journal of Microscopy|March 31, 2004
Magnetic characterization of microscopic particles by MO-SNOMJ Schoenmaker, M S Lancarotte, A C Seabra, et al.
Journal of Microscopy|March 31, 2004
Quantitative phase-amplitude microscopy. III. The effects of noiseD Paganin, A Barty, P J McMahon, et al.
Journal of Microscopy|April 23, 2004
High resolution NMR microscopy of plants and fungiW Köckenberger, C De Panfilis, D Santoro, et al.
Journal of Microscopy|May 26, 2004
Using the FIB to characterize nanoparticle materialsC R Perrey, C B Carter, J R Michael, et al.
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