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Journal of Microscopy|July 17, 2001
In situ observation of oxygen deficiency occurring during electron irradiation in high Tc superconductor YBa2Cu3OyZ Akase, Y Tomokiyo, M WatanabeJournal of Microscopy|July 17, 2001
Dynamic chemical mapping near a Si/SiO2 interface at elevated temperatures using plasmon-loss imagesK Sasaki, S Tsukimoto, M Konno, et al.Journal of Microscopy|July 17, 2001
In situ high resolution electron microscopy/electron energy loss spectroscopy observation of wetting of a Si surface by molten AlS Tsukimoto, S Arai, M Konno, et al.Journal of Microscopy|July 17, 2001
In situ observation of the initial growth process of carbon nanotubes by time-resolved high resolution transmission electron microscopyH Watanabe, Y Hisada, S Mukainakano, et al.Journal of Microscopy|July 17, 2001
Dislocation mobility and electronic effects in semiconductor compoundsG Vanderschaeve, C Levade, D CaillardJournal of Microscopy|December 12, 2001
Studies of cell division (mitosis and cytokinesis) by dynamic secondary ion mass spectrometry ion microscopy: LLC-PK1 epithelial cells as a model for subcellular isotopic imagingS ChandraJournal of Microscopy|September 17, 2002
On the influence of imaging conditions and algorithms on the quantification of surface topographyU Wendt, K Stiebe-Lange, M SmidJournal of Microscopy|September 17, 2002
Precision of circular systematic samplingL M Cruz-Orive, X Gual-ArnauJournal of Microscopy|July 24, 2002
Embedding in Spurr's resin is a good choice for immunolabelling after freeze drying as shown with chemically unfixed dendritic cellsD Spehner, R Drillien, F Proamer, et al.Pageof 486