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Journal of Microscopy|May 10, 2002
Use of emission electron microscope for potential mapping in semiconductor microelectronicsS A Nepijko, N N Sedov, G Schönhense, et al.
Journal of Microscopy|May 10, 2002
Light microscopy evaluation of polyurethane vascular grafts porosity by Sudan Black B stainingG Soldani, P Losi, C Milioni, et al.
Journal of Microscopy|April 16, 2003
Bandstructure approach to near edge structureA T Paxton, A J Craven, J M Gregg, et al.
Journal of Microscopy|April 16, 2003
N-K ELNES study of anisotropy effects in hexagonal AlNG Radtke, T Epicier, P Bayle-Guillemaud, et al.
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