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Journal of Microscopy|April 20, 2001
Combining AFM and FRET for high resolution fluorescence microscopyS A Vickery, R C Dunn
Journal of Microscopy|May 13, 1999
Energy-filtered transmission electron microscopy of multilayers in semiconductorsLiu, Boothroyd, Humphreys
Journal of Microscopy|May 13, 1999
How to optimize the design of a quantitative HREM experiment so as to attain the highest precisionDen Dekker AJ, Sijbers, Van Dyck D
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