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Journal of Microscopy|February 21, 2025
Uncertainties in interfacial excess calculations from atom probe tomography dataLevi Tegg, Julie M CairneyJournal of Microscopy|August 8, 2024
Analysis of the Ag M4,5 EELS edge to study silver nanoparticle corrosionJ C Brennan, D A MacLarenJournal of Microscopy|June 16, 2006
Automated microscopy system for mosaic acquisition and processingS K Chow, H Hakozaki, D L Price, et al.Journal of Microscopy|July 29, 2006
New variance expressions for systematic sampling: the filtering approachXimo Gual-Arnau, Luis M Cruz-OriveJournal of Microscopy|July 29, 2006
Evaluation of variance models for fractionator sampling of treesG M Maletti, D WulfsohnJournal of Microscopy|July 29, 2006
A new fractionator principle with varying sampling fractions: exemplified by estimation of synapse number using electron microscopyB M Witgen, M S Grady, J R Nyengaard, et al.Journal of Microscopy|July 29, 2006
Optimized HREM imaging of objects supported by amorphous substrates using spherical aberration adjustmentNicholas A Allsop, Peter J Dobson, John L HutchisonJournal of Microscopy|July 29, 2006
An automatic method for identifying appropriate gradient magnitude for 3D boundary detection of confocal image stacksY Q Guan, Y Y Cai, Y T Lee, et al.Journal of Microscopy|September 1, 1990
Fluorescence quenching; a practical problem in flow cytometryM R Chapple, G D Johnson, R S DavidsonJournal of Microscopy|May 1, 1990
Study of Golgi-impregnated material using the confocal tandem scanning reflected light microscopeM Freire, A BoydePageof 483