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Journal of Microscopy|November 15, 2006
The effect of an Ni-Cr protective layer on cyclic oxidation of TiAlI Cvijović, M T Jovanović, D Vasiljević-Radović, et al.Journal of Microscopy|November 15, 2006
New system for secondary electron detection in variable-pressure scanning electron microscopyW SlówkoJournal of Microscopy|November 15, 2006
Buried amorphous-layer impact on dislocation densities in siliconM Wzorek, J Katcki, M Płuska, et al.Journal of Microscopy|November 15, 2006
The structure and mechanical properties of amorphous and nanocrystalline Fe-Si-B alloysA Sypień, J KusińskiJournal of Microscopy|November 15, 2006
The effect of coarse intermetallic particles on the fracture process in forged 7000 alloysM Vratnica, Z Cvijović, H P Degischer, et al.Journal of Microscopy|November 15, 2006
Transmission electron microscopy analysis of phase separation in GaInAsSb films grown on GaSb substrateP Szczeszek, A Amariei, J Schöne, et al.Journal of Microscopy|July 7, 2005
Performance of a mixed Lagrange time delay estimation autoregressive (MLTDEAR) model for single-image signal- to-noise ratio estimation in scanning electron microscopyK S Sim, H T Chuah, C ZhengJournal of Microscopy|January 11, 2007
Guided-wave and ellipsometric imaging of supported cellsM Bivolarska, T Velinov, S StoitsovaJournal of Microscopy|January 11, 2007
Transmission electron microscope specimen preparation for exploring the buried interfaces in plan viewG Z Radnóczi, B PéczJournal of Microscopy|January 6, 2007
Application of the focused ion beam technique in aerosol science: detailed investigation of selected, airborne particlesR Kaegi, Ph GasserPageof 483