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Journal of Research of the National Institute of Standards and Technology|June 9, 2016
RM 8111: Development of a Prototype Linewidth StandardMichael W Cresswell, William F Guthrie, Ronald G Dixson, et al.Journal of Research of the National Institute of Standards and Technology|July 2, 2016
Polycapillary Optics for Materials Science Studies: Instrumental Effects and Their CorrectionM Leoni, U Welzel, P ScardiJournal of Research of the National Institute of Standards and Technology|July 2, 2016
Diffraction Line Broadening Analysis if Broadening Is Caused by Both Dislocations and Limited Crystallite SizeJ-D Kamminga, L J SeijbelJournal of Research of the National Institute of Standards and Technology|July 2, 2016
Global Rietveld RefinementKenneth ShanklandJournal of Research of the National Institute of Standards and Technology|July 2, 2016
Bayesian Inference of Nanoparticle-Broadened X-Ray Line ProfilesNicholas Armstrong, Walter Kalceff, James P Cline, et al.Journal of Research of the National Institute of Standards and Technology|July 2, 2016
Characterization of Combinatorial Polymer Blend Composition Gradients by FTIR MicrospectroscopyNaomi Eidelman, Carl G SimonJournal of Research of the National Institute of Standards and Technology|July 2, 2016
Standard Reference Materials (SRMs) for the Calibration and Validation of Analytical Methods for PCBs (as Aroclor Mixtures)Dianne L Poster, Michele M Schantz, Stefan D Leigh, et al.Journal of Research of the National Institute of Standards and Technology|July 2, 2016
Erratum: New National Air-Kerma-Strength Standards for (125)I and (103)Pd Brachytherapy SeedsStephen M Seltzer, Paul J Lamperti, Robert Loevinger, et al.Journal of Research of the National Institute of Standards and Technology|July 2, 2016
Initial NIST AC QHR MeasurementsM E Cage, S H Shields, A JefferyJournal of Research of the National Institute of Standards and Technology|July 2, 2016
Frequency-Domain Models for Nonlinear Microwave Devices Based on Large-Signal MeasurementsJeffrey A Jargon, Donald C DeGroot, K C GuptaPageof 111