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Journal of Synchrotron Radiation|July 21, 2004
X-ray characterization of alpha-Fe(2)O(3) single crystals containing 2.2% and 95% (57)FeJ Y Zhao, X W Zhang, M Ando, et al.Journal of Synchrotron Radiation|July 21, 2004
Precision goniometer equipped with a 22-bit absolute rotary encoderZ Xiaowei, M Ando, W JidongJournal of Synchrotron Radiation|July 21, 2004
Observation of the strain field near the Si(111) 7 x 7 surface with a new X-ray diffraction techniqueT Emoto, K Akimoto, A IchimiyaJournal of Synchrotron Radiation|July 21, 2004
X-ray parametric scattering by a diamond crystalY Yoda, T Suzuki, X W Zhang, et al.Journal of Synchrotron Radiation|July 21, 2004
X-ray magnetic reflectometry using circularly polarized radiationC Neumann, A Rogalev, J Goulon, et al.Journal of Synchrotron Radiation|July 21, 2004
Pump and probe X-ray absorption fine structure using high-brilliance photon sourcesH Oyanagi, A Kolobov, K TanakaJournal of Synchrotron Radiation|July 21, 2004
An ultrahigh-vacuum goniometer for in situ soft X-ray standing-wave analysis of semiconductor surfacesM Sugiyama, S MaeyamaJournal of Synchrotron Radiation|July 21, 2004
Angle-resolved UV photoelectron spectra (UPS) of thin films of perylene-3,4,9,10-tetracarboxylic dianhydride on MoS(2)Y Azuma, T Hasebe, T Miyamae, et al.Journal of Synchrotron Radiation|July 21, 2004
Trace element analysis on Si wafer surfaces by TXRF at the ID32 ESRF undulator beamlineL Ortega, F Comin, V Formoso, et al.Journal of Synchrotron Radiation|July 21, 2004
High-resolution X-ray topographic images of dislocations in a silicon crystal recorded using an X-ray zooming tubeS Kimura, T Matsumura, K Kinoshita, et al.Pageof 458