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Microscopy (Oxford, England)|September 4, 2016
Foucault imaging and small-angle electron diffraction in controlled external magnetic fieldsHiroshi Nakajima, Atsuhiro Kotani, Ken Harada, et al.
Microscopy (Oxford, England)|September 10, 2016
Strain mapping in a nanoscale-triangular SiGe pattern by dark-field electron holography with medium magnification modeVan Vuong Hoang, Youngji Cho, Jung Ho Yoo, et al.
Microscopy (Oxford, England)|September 23, 2016
Direct visualization of lithium via annular bright field scanning transmission electron microscopy: a reviewScott David Findlay, Rong Huang, Ryo Ishikawa, et al.
Microscopy (Oxford, England)|September 23, 2016
Electron microscopic study of capillary network remodeling in the extensor digitorum longus muscle of normal adult ratShuji Kitahara, Junzo Desaki, Asuka Yoshii, et al.
Microscopy (Oxford, England)|February 18, 2015
In situ SEM observation of the Si negative electrode reaction in an ionic-liquid-based lithium-ion secondary batteryTetsuya Tsuda, Tsukasa Kanetsuku, Teruki Sano, et al.
Microscopy (Oxford, England)|February 26, 2015
Scanning electron microscopy for flow-diverting stent research: technical tips and tricksChristina Iosif, Pierre Carles, Gilles Trolliard, et al.
Microscopy (Oxford, England)|February 1, 2015
Quantitative annular dark-field imaging of single-layer grapheneShunsuke Yamashita, Shogo Koshiya, Kazuo Ishizuka, et al.
Microscopy (Oxford, England)|February 28, 2023
Low-dose measurement of electric potential distribution in organic light-emitting diode by phase-shifting electron holography with 3D tensor decompositionYusei Sasaki, Kazuo Yamamoto, Satoshi Anada, et al.
Microscopy (Oxford, England)|August 12, 2016
Quantitative measurement of hydrophilicity/hydrophobicity of the plasma-polymerized naphthalene film (Super Support Film) and other support films and grids in electron microscopyMasashi Yamaguchi, Toshihiro Aoyama, Norihiro Yamada, et al.
Microscopy (Oxford, England)|June 28, 2015
Crack tip shielding observed with high-resolution transmission electron microscopyDamar Rastri Adhika, Masaki Tanaka, Takeshi Daio, et al.
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