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Microscopy (Oxford, England)|June 4, 2014
Analysis of nonlinear intensity attenuation in bright-field TEM images for correct 3D reconstruction of the density in micron-sized materialsJun Yamasaki, Michihiro Mutoh, Shigemasa Ohta, et al.Microscopy (Oxford, England)|January 6, 2015
Laser-assisted sample preparation of silicon for high-resolution transmission electron microscopyNorihito Sakaguchi, Munehiro Kozuka, Hideki IchinoseMicroscopy (Oxford, England)|September 16, 2015
Analysis of improvement in performance and design parameters for enhancing resolution in an atmospheric scanning electron microscopeYeo Hun Yoon, Seung Jae Kim, Dong Hwan KimMicroscopy (Oxford, England)|August 15, 2015
Experimental evaluation of spatial resolution in phase maps retrieved by transport of intensity equationXiaobin Zhang, Yoshifumi OshimaMicroscopy (Oxford, England)|October 11, 2017
Basics and applications of ELNES calculationsHidekazu Ikeno, Teruyasu MizoguchiMicroscopy (Oxford, England)|October 12, 2018
Hard X-ray imaging microscopy with self-imaging phenomenonWataru YashiroMicroscopy (Oxford, England)|December 1, 2021
Direct observation of the moment of nucleation from a solution by TEMYuki KimuraMicroscopy (Oxford, England)|December 9, 2021
Quadruple node of triple junctions of grain boundaries in a Eu2+-doped solid solution of the ions K+, Rb+, Cl- and Br-: an epifluorescence microscopy study using the doping ion as a fluorochromeAdolfo Ernesto Cordero-Borboa, Rodrigo Unda-AngelesMicroscopy (Oxford, England)|March 14, 2022
Classification for transmission electron microscope images from different amorphous states using persistent homologyFumihiko Uesugi, Masashi IshiiPageof 82