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Microscopy (Oxford, England)|January 22, 2025
Noise reduction of low-dose electron holograms using the wavelet hidden Markov modelYuto Tomita, Yoshihiro Midoh, Takehiro Tamaoka, et al.Microscopy (Oxford, England)|August 29, 2024
Precise measurement of spatial coherence and axial brightness based on the Wigner function reconstruction in transmission electron microscopes with field emission guns and a thermionic emission gunShuhei Hatanaka, Jun YamasakiMicroscopy (Oxford, England)|October 30, 2024
Improved dopant fraction variance estimation in statistical ALCHEMI based on correct error propagation ruleAkimitsu Ishizuka, Masahiro Ohtsuka, Shunsuke MutoMicroscopy (Oxford, England)|July 25, 2024
Near-field electron ptychography using full-field structured illuminationHirokazu Tamaki, Koh SaitohMicroscopy (Oxford, England)|July 24, 2024
Deciphering prefrontal circuits underlying stress and depression: exploring the potential of volume electron microscopyHirotaka NagaiMicroscopy (Oxford, England)|September 12, 2023
Applications of electron microscopic observations to electrochemistry in liquid electrolytes for batteriesKaname Yoshida, Yuki Sasaki, Akihide Kuwabara, et al.Microscopy (Oxford, England)|September 13, 2023
In-situ shearing process observation system for soft materials via transmission electron microscopyTomohiro Miyata, Hsiao-Fang Wang, Daisuke Watanabe, et al.Microscopy (Oxford, England)|January 16, 2024
Three-dimensional nanostructure analysis of non-stained Nafion in fuel-cell electrode by combined ADF-STEM tomographyTakuji UbeMicroscopy (Oxford, England)|March 18, 2024
Limitations and drawbacks of DQE estimation methods applied to electron detectorsOlivier Marcelot, Cécile Marcelot, Sébastien RolandoMicroscopy (Oxford, England)|March 7, 2024
Effective alignment method using a diamond notch knife for correlative array tomographyYumi Goto, Noriko Takeda-Kamiya, Kaori Yamaguchi, et al.Pageof 82