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Microscopy (Oxford, England)|February 4, 2014
Statistical distribution of single atoms and clusters of supported Au catalyst analyzed by global high-resolution HAADF-STEM observation with morphological image-processing operationYuta Yamamoto, Shigeo Arai, Akihiko Esaki, et al.Microscopy (Oxford, England)|January 31, 2025
Experimental investigation and simulation of SEM image intensity behaviors for developing thickness-controlled S/TEM lamella preparation via FIB-SEMJun Uzuhashi, Yuanzhao Yao, Tadakatsu Ohkubo, et al.Microscopy (Oxford, England)|January 13, 2025
Efficient Data Sampling Scheme to Reduce Acquisition Time in Statistical ALCHEMIAkimitsu Ishizuka, Masahiro Ohtsuka, Shunsuke MutoMicroscopy (Oxford, England)|October 16, 2024
Acceptance characterization of electron detector in SEM using stainless steel sphereTakashi Sekiguchi, Yuanzhao Yao, Ryosuke Sonoda, et al.Microscopy (Oxford, England)|September 16, 2024
Development of a localized surface plasmon-enhanced electron beam-pumped nanoscale light source for electron beam excitation-assisted optical microscopyAtsushi Nakamura, Shunpei Shiba, Kei Hosomi, et al.Microscopy (Oxford, England)|March 4, 2025
Seg and Ref: A Newly Developed Toolset for Artificial Intelligence-Powered Segmentation and Interactive Refinement for Labor-Saving Three-Dimensional ReconstructionSatoru Muro, Takuya Ibara, Akimoto Nimura, et al.Microscopy (Oxford, England)|March 4, 2025
Journey from Image Acquisition to Biological Insight: Handling and Analyzing Large Volumes of Light-Sheet Imaging DataYuko Mimori-KiyosueMicroscopy (Oxford, England)|March 4, 2025
Cryo-STEM Tomography for Cell biology Using Thick LamellaKazuhiro Aoyama, Hiroko Takazaki, Misaki Arie, et al.Microscopy (Oxford, England)|June 29, 2024
Simultaneous observation of multiple interferograms with Mach-Zehnder type electron interferometer on a 1.2-MV field-emission transmission electron microscopeTetsuya Akashi, Yoshio Takahashi, Ken HaradaMicroscopy (Oxford, England)|November 21, 2019
Atomistic and dynamic structural characterizations in low-dimensional materials: recent applications of in situ transmission electron microscopyHe Zheng, Fan Cao, Ligong Zhao, et al.Pageof 82