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The Review of Scientific Instruments|February 2, 2011
High-pressure x-ray diffraction studies on the structure of liquid silicate using a Paris-Edinburgh type large volume pressAkihiro Yamada, Yanbin Wang, Toru Inoue, et al.The Review of Scientific Instruments|February 2, 2011
A wavelet transform algorithm for peak detection and application to powder x-ray diffraction dataJohn M Gregoire, Darren Dale, R Bruce van DoverThe Review of Scientific Instruments|February 2, 2011
Development and application of a continuous measurement system for radon exhalation rateMasahiro Hosoda, Tetsuo Ishikawa, Atsuyuki Sorimachi, et al.The Review of Scientific Instruments|January 5, 2011
Modulated 3D cross-correlation light scattering: improving turbid sample characterizationIan D Block, Frank ScheffoldThe Review of Scientific Instruments|January 5, 2011
The rotating wall machine: a device to study ideal and resistive magnetohydrodynamic stability under variable boundary conditionsC Paz-Soldan, W F Bergerson, M I Brookhart, et al.The Review of Scientific Instruments|January 5, 2011
Hard x-ray correlation analysis as a diagnostic tool for the measurement of magnetic turbulence in tokamaksS K Saha, A K Hui, S Chowdhury, et al.The Review of Scientific Instruments|January 5, 2011
Development of a digital integrator for the KSTAR deviceSeong-Heon Seo, Andreas Werner, M MarquardtThe Review of Scientific Instruments|January 5, 2011
Nanoscale potential measurements in liquid by frequency modulation atomic force microscopyNaritaka Kobayashi, Hitoshi Asakawa, Takeshi FukumaThe Review of Scientific Instruments|January 5, 2011
Microwave atomic force microscopy imaging for nanometer-scale electrical property characterizationLan Zhang, Yang Ju, Atsushi Hosoi, et al.The Review of Scientific Instruments|January 5, 2011
Two-color optical charge-coupled-device-based pyrometer using a two-peak filterTairan Fu, Huan Zhao, Jun Zeng, et al.Pageof 2,067