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The Review of Scientific Instruments|May 2, 2009
Characterizing piezoscanner hysteresis and creep using optical levers and a reference nanopositioning stageH Xie, M Rakotondrabe, S Régnier
The Review of Scientific Instruments|May 2, 2009
Small angle x-ray scattering with a beryllium compound refractive lens as focusing opticAndreas Timmann, Ralph Döhrmann, Tom Schubert, et al.
The Review of Scientific Instruments|May 2, 2009
X-ray- and electron-induced infrared emission spectroscopyR A Rosenberg, M Abu Haija, S P Watkins
The Review of Scientific Instruments|May 2, 2009
A 2.8 K cryogen-free cryostat with compact optical geometry for multiple photon countingM-A Verdier, P C F Di Stefano, F Bonte, et al.
The Review of Scientific Instruments|May 2, 2009
Quantitative optical recognition of highly reproducible ultrathin oxide films in microelectrochemical anodizationAndrei Ionut Mardare, Achim Walter Hassel
The Review of Scientific Instruments|May 2, 2009
Determination of energy band gap of nanocrystalline SbSI using diffuse reflectance spectroscopyM Nowak, B Kauch, P Szperlich
The Review of Scientific Instruments|May 17, 2007
Large atom number Bose-Einstein condensate of sodiumK M R van der Stam, E D van Ooijen, R Meppelink, et al.
The Review of Scientific Instruments|May 17, 2007
Discrete retardance second harmonic generation ellipsometryChristopher J Dehen, R Michael Everly, Ryan M Plocinik, et al.
The Review of Scientific Instruments|May 17, 2007
New developments for an electron impact (e,2e)(e,3e) spectrometer with multiangle collection and multicoincidence detectionF Catoire, E M Staicu-Casagrande, A Lahmam-Bennani, et al.
The Review of Scientific Instruments|May 17, 2007
Photoreflectance spectroscopy with a step-scan Fourier-transform infrared spectrometer: technique and applicationsJun Shao, Wei Lu, Fangyu Yue, et al.
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