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Ultramicroscopy|July 15, 2026
The distinct displacement of atomic column position induced by crystal symmetry effects in ABF-STEM and iDPC-STEM imagingXianlin Qu, Ren Xu, Bowen Liu, et al.Ultramicroscopy|April 24, 2009
Refinement of the 200 structure factor for GaAs using parallel and convergent beam electron nanodiffraction dataKnut Müller, Marco Schowalter, Jacob Jansen, et al.Ultramicroscopy|January 17, 2018
Electron CHanneling ORientation Determination (eCHORD): An original approach to crystalline orientation mappingC Lafond, T Douillard, S Cazottes, et al.Ultramicroscopy|January 25, 2011
Using atom probe tomography to analyse MAX-phase materialsM Sonestedt, K StillerUltramicroscopy|December 16, 2014
Simultaneous orientation and thickness mapping in transmission electron microscopyDmitry Tyutyunnikov, V Burak Özdöl, Christoph T KochUltramicroscopy|September 13, 2015
Height-resolved quantification of microstructure and texture in polycrystalline thin films using TEM orientation mappingA Brian Aebersold, Duncan T L Alexander, Cécile HébertUltramicroscopy|June 7, 2000
The dependence of equilibrium film thickness on grain orientation at interphase boundaries in ceramic-ceramic compositesKnowles, TuranUltramicroscopy|July 23, 2003
Plasmon energy mapping in energy-filtering transmission electron microscopyW Sigle, S Krämer, V Varshney, et al.Ultramicroscopy|May 4, 2001
Strul--a method for 3D alignment of single-particle projections based on common line correlation in Fourier spaceM LindahlUltramicroscopy|May 4, 2001
An accurate analytical approach to electron crystallographyQ Yang, Y Wang, Q Liu, et al.Pageof 458