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Ultramicroscopy|February 22, 2022
Stroboscopic ultrafast imaging using RF strip-lines in a commercial transmission electron microscopeSpencer A Reisbick, Myung-Geun Han, Chuhang Liu, et al.
Ultramicroscopy|August 27, 2021
The influence of chromatic aberration on the dose-limited spatial resolution of transmission electron microscopyEduardo Ortega, Chris Boothroyd, Niels de Jonge
Ultramicroscopy|May 24, 2021
Comparative image simulations for phase-plate transmission electron microscopySimon Hettler, Raul Arenal
Ultramicroscopy|August 27, 2022
Exploration of atom probe tomography at sub-10KAlec C Day, Andrew J Breen, David A Reinhard, et al.
Ultramicroscopy|November 3, 2022
Complementary ADF-STEM: a Flexible Approach to Quantitative 4D-STEMBryan D Esser, Joanne Etheridge
Ultramicroscopy|June 11, 2023
Temporal coherence envelope function of field emission in electron microscopyXuan Tan Nguyen, Michael S Altman
Ultramicroscopy|June 10, 2023
Multi-scale time-resolved electron diffraction: A case study in moiré materialsC J R Duncan, M Kaemingk, W H Li, et al.
Ultramicroscopy|August 12, 2026
Channeling-in channeling-out revisited: selected area electron channeling and electron backscatter diffractionT Ben Britton, M Haroon Qaiser, Ruth M Birch
Ultramicroscopy|August 20, 2026
On the accuracy of atomic-resolution electrostatic measurements in 2D materialsRafael V Ferreira, Sebastian Calderon V, Paulo J Ferreira
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