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Ultramicroscopy|September 8, 2001
Validity of the dipole-selection rule for the Al-L2,3 edge of alpha-Al2O3 under channeling conditionsS Nufer, T Gemming, S Köstlmeier, et al.
Ultramicroscopy|May 11, 2000
The orientation-dependent simulation of ELNESHebert-Souche, Louf, Blaha, et al.
Ultramicroscopy|May 11, 2000
Charging phenomena in PEEM imaging and spectroscopyB Gilbert, R Andres, P Perfetti, et al.
Ultramicroscopy|August 17, 2000
Modulation imaging in reflection-mode near-field scanning optical microscopyKerimo, Buchler, Smyrl
Ultramicroscopy|August 17, 2000
Near-field scanning optical microscopy of zinc-porphyrin crystalsR Brunner, M E Kosal, K S Suslick, et al.
Ultramicroscopy|August 17, 2000
Computed tomography of cryogenic biological specimens based on X-ray microscopic imagesD Weiss, G Schneider, B Niemann, et al.
Ultramicroscopy|August 17, 2000
TEM measurement of strain in coherent quantum heterostructuresMiller, Liu, Gibson
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