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Ultramicroscopy|August 17, 2000
Near-field scanning optical microscopy of zinc-porphyrin crystalsR Brunner, M E Kosal, K S Suslick, et al.Ultramicroscopy|August 17, 2000
Computed tomography of cryogenic biological specimens based on X-ray microscopic imagesD Weiss, G Schneider, B Niemann, et al.Ultramicroscopy|August 17, 2000
TEM measurement of strain in coherent quantum heterostructuresMiller, Liu, GibsonUltramicroscopy|April 27, 2000
Analysis of local strain in aluminium interconnects by energy filtered CBEDKramer, Mayer, Witt, et al.Ultramicroscopy|April 27, 2000
Rietveld analysis of electron powder diffraction data from nanocrystalline anatase, TiO2Weirich, Winterer, Seifried, et al.Ultramicroscopy|January 17, 2002
Characterization of AC mode scanning ion-conductance microscopyD Pastré, H Iwamoto, J Liu, et al.Ultramicroscopy|January 17, 2002
Imaging charged objects using low-energy-electron coherent beamsV Georges, J Bardon, A Degiovanni, et al.Ultramicroscopy|January 17, 2002
Wave field restoration using three-dimensional Fourier filtering methodT Kawasaki, Y Takai, T Ikuta, et al.Ultramicroscopy|January 17, 2002
Negative staining permits 4.0 A resolution with low-dose electron diffraction of catalase crystalsW H Massover, P F Lai, P MarshUltramicroscopy|January 5, 2002
Prototypes using metal, carbon fiber and composite field emission sources modulated by a laser beamM S Mousa, M Brugat, E P Sheshin, et al.Pageof 458