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Ultramicroscopy|January 5, 2002
In situ dynamic study of hydrogen oxidation on rhodiumT Visart de Bacarmé, T Bär, N KruseUltramicroscopy|September 6, 2002
Transfer-matrix simulations of field emission from a metallic (5,5) carbon nanotubeA Mayer, N M Miskovsky, P H CutlerUltramicroscopy|September 6, 2002
High-resolution imaging with an aberration-corrected transmission electron microscopeM Lentzen, B Jahnen, C L Jia, et al.Ultramicroscopy|September 6, 2002
Optical interference artifacts in contact atomic force microscopy imagesA Méndez-Vilas, M L González-Martin, M J NuevoUltramicroscopy|September 5, 2002
Micromechanical measurement of active sites on silicon nitride using surface free energy variationA C Stephan, E L Finot, H F Ji, et al.Ultramicroscopy|September 5, 2002
Read/write mechanisms and data storage system using atomic force microscopy and MEMS technologyHyunjung Shi, Seungbum Hong, Jooho Moon, et al.Ultramicroscopy|September 5, 2002
Current and potential characterization on InAs nanowires by contact-mode atomic force microscopy and Kelvin probe force microscopyShiano On, Misaichi Takeuchi, Takuji TakahashiUltramicroscopy|September 5, 2002
Direct observation of polyhydroxyalkanoate chains by atomic force microscopyKumar Sudesh, Zhihua Gan, Ken'ichiro Matsumot, et al.Ultramicroscopy|September 5, 2002
A study of positive charge effect on AFM anodization lithography using metal phosphate monolayersSang Min Kim, Sang Jung Ahn, Haeseong Lee, et al.Ultramicroscopy|September 5, 2002
Effect of temperature on friction observed between a Si3N4 tip and a dodecanethiol self-assembled monolayer on Au(1 1 1)Mitsuhiro Fujita, Masamichi FujihiraPageof 460