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Ultramicroscopy|June 23, 2001
Development of a quantitative energy filtering TEM method to study a reactive NiO/80Ni20Fe interfaceP Bayle-Guillemaud, A Barbier, C Mocuta
Ultramicroscopy|April 20, 2001
Coated silica tips for use in high-pressure, high-temperature, scanning tunneling microscopyB L Weeks, Z H Barber, M Raval, et al.
Ultramicroscopy|April 20, 2001
Electric charging of thin films measured using the contrast transfer functionK Danov, R Danev, K Nagayama
Ultramicroscopy|April 20, 2001
Semi-automatized processing of AFM force-spectroscopy dataC Gergely, B Senger, J C Voegel, et al.
Ultramicroscopy|April 20, 2001
Determination of the orientation in small areas of the exit waveR M Bokel, J Jansen, H W Zandbergen
Ultramicroscopy|December 31, 2002
Measuring the PSF from aperture images of arbitrary shape--an algorithmP N H Nakashima, A W S Johnson
Ultramicroscopy|December 31, 2002
Semiconductor dopant profiling by off-axis electron holographyJing Li, M R McCartney, David J Smith
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