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Ultramicroscopy|April 4, 2003
DNA height in scanning force microscopyF Moreno-Herrero, J Colchero, A M BaróUltramicroscopy|April 4, 2003
Objective evaluation of the relative modulation transfer function of densitometers for digitisation of electron micrographsA M Roseman, K NeumannUltramicroscopy|November 21, 2021
Wavelength-multiplexed single-shot ptychographyJonathan Barolak, David Goldberger, Jeff Squier, et al.Ultramicroscopy|December 5, 2021
Thermal characterization of morphologically diverse copper phthalocyanine thin layers by scanning thermal microscopyDominika Trefon-Radziejewska, Justyna Juszczyk, Maciej Krzywiecki, et al.Ultramicroscopy|February 18, 2019
Low-dose low-scattering X-ray computed tomography with high-spatial-energy resolutions using a cooled cadmium telluride detectorHodaka Moriyama, Manabu Watanabe, Shinya Kusachi, et al.Ultramicroscopy|November 16, 2018
Thermoelectric stack sample cooling modification of a commercial atomic force microscopyA Del Moral, J C González-Rosillo, A Gómez, et al.Ultramicroscopy|March 15, 2019
A low-energy electron point-source projection microscope not using a sharp metal tip performs well in long-range imagingEvelyne Salançon, Alain Degiovanni, Laurent Lapena, et al.Ultramicroscopy|March 31, 2019
Simultaneous determination of local thickness and composition for ternary III-V semiconductors by aberration-corrected STEMP Kükelhan, A Beyer, S Firoozabadi, et al.Ultramicroscopy|April 2, 2019
Optimization of off-axis electron holography performed with femtosecond electron pulsesF Houdellier, G M Caruso, S Weber, et al.Pageof 460