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Ultramicroscopy|March 15, 2019
A low-energy electron point-source projection microscope not using a sharp metal tip performs well in long-range imagingEvelyne Salançon, Alain Degiovanni, Laurent Lapena, et al.
Ultramicroscopy|March 31, 2019
Simultaneous determination of local thickness and composition for ternary III-V semiconductors by aberration-corrected STEMP Kükelhan, A Beyer, S Firoozabadi, et al.
Ultramicroscopy|April 2, 2019
Optimization of off-axis electron holography performed with femtosecond electron pulsesF Houdellier, G M Caruso, S Weber, et al.
Ultramicroscopy|February 24, 2019
Early-stage NiCrMo oxidation revealed by cryo-transmission electron microscopyAlex Y W Lin, Alexander Müller, Xiao-Xiang Yu, et al.
Ultramicroscopy|August 23, 2019
On the residual six-fold astigmatism in DCOR/ASCORP Hartel, V Gerheim, M Linck, et al.
Ultramicroscopy|September 9, 2019
A method for constrained optimisation of the design of a scanning helium microscopeM Bergin, D J Ward, J Ellis, et al.
Ultramicroscopy|January 11, 2022
Factors limiting quantitative phase retrieval in atomic-resolution differential phase contrast scanning transmission electron microscopy using a segmented detectorT Mawson, D J Taplin, H G Brown, et al.
Ultramicroscopy|January 6, 2022
Standard deviation of microscopy images used as indicator for growth stagesThorsten Wagner, Grażyna Antczak, Ebrahim Ghanbari, et al.
Ultramicroscopy|January 8, 2022
Properties of blade-like field emittersSergey V Filippov, Fernando F Dall'Agnol, Thiago A de Assis, et al.
Ultramicroscopy|March 26, 2014
SEM method for direct visual tracking of nanoscale morphological changes of platinum based electrocatalysts on fixed locations upon electrochemical or thermal treatmentsMilena Zorko, Barbara Jozinović, Marjan Bele, et al.
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