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Ultramicroscopy|April 23, 2017
Optimising multi-frame ADF-STEM for high-precision atomic-resolution strain mappingLewys Jones, Sigurd Wenner, Magnus Nord, et al.Ultramicroscopy|March 25, 2021
Directly correlated microscopy of trench defects in InGaN quantum wellsT J O'Hanlon, F C-P Massabuau, A Bao, et al.Ultramicroscopy|February 14, 2012
Photoelectron spectromicroscopy at chalcopyrite filmsC Pettenkofer, A Hofmann, W Bremsteller, et al.Ultramicroscopy|February 11, 2012
Improved multislice calculations for including higher-order Laue zones effectsI Lobato, D Van DyckUltramicroscopy|September 28, 2011
Introducing measure-by-wire, the systematic use of systems and control theory in transmission electron microscopyArturo Tejada, Arnold J den Dekker, Wouter Van den BroekUltramicroscopy|January 3, 2012
Prospects for electron microscopy characterisation of solar cells: opportunities and challengesB G Mendis, K DuroseUltramicroscopy|December 31, 2011
Effect of sample tilt on PEEM resolutionMartin Oral, Tomáš Radlička, Bohumila LencováUltramicroscopy|December 31, 2011
A surprise in the first Born approximation for electron scatteringM M J Treacy, D Van DyckUltramicroscopy|December 31, 2011
Localization of inelastic electron scattering in the low-loss energy regimeWu Zhou, Stephen J Pennycook, Juan-Carlos IdroboUltramicroscopy|December 31, 2011
Aberrations in asymmetrical electron lensesJ P S Fitzgerald, R C Word, R KönenkampPageof 458